{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T15:37:24Z","timestamp":1774366644876,"version":"3.50.1"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/test.2015.7342383","type":"proceedings-article","created":{"date-parts":[[2015,12,3]],"date-time":"2015-12-03T21:11:39Z","timestamp":1449177099000},"page":"1-8","source":"Crossref","is-referenced-by-count":26,"title":["Embedded deterministic test points for compact cell-aware tests"],"prefix":"10.1109","author":[{"given":"Cesar","family":"Acero","sequence":"first","affiliation":[]},{"given":"Derek","family":"Feltham","sequence":"additional","affiliation":[]},{"given":"Friedrich","family":"Hapke","sequence":"additional","affiliation":[]},{"given":"Elham","family":"Moghaddam","sequence":"additional","affiliation":[]},{"given":"Nilanjan","family":"Mukherjee","sequence":"additional","affiliation":[]},{"given":"Vidya","family":"Neerkundar","sequence":"additional","affiliation":[]},{"given":"Marek","family":"Patyra","sequence":"additional","affiliation":[]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[]},{"given":"Jerzy","family":"Tyszer","sequence":"additional","affiliation":[]},{"given":"Justyna","family":"Zawada","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2323216"},{"key":"ref11","first-page":"501","article-title":"Synthesis of pseudorandom pattern testable designs","author":"iyengar","year":"0","journal-title":"Proc ITC"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.40"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2013.45"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1997.643983"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICDSN.2000.857564"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355747"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.39"},{"key":"ref18","first-page":"253","article-title":"Test point insertion for scan-based BIST","author":"seiss","year":"0","journal-title":"Proc ETC"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.260953"},{"key":"ref4","first-page":"658","article-title":"A novel combinational testability analysis by considering signal correlation","author":"chang","year":"0","journal-title":"Proc ITC"},{"key":"ref3","article-title":"Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits","author":"bushnell","year":"2000"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894217"},{"key":"ref5","first-page":"506","article-title":"Timing-driven test point insertion for full-scan and partial-scan BIST","author":"cheng","year":"0","journal-title":"Proc ITC 1995"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585245"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041754"},{"key":"ref2","first-page":"274","article-title":"Random pattern testability by fault simulation","author":"briers","year":"0","journal-title":"Proc ITC"},{"key":"ref1","first-page":"705","article-title":"Applications of testability analysis: from ATPG to critical delay path tracing","author":"brglez","year":"1984","journal-title":"Proc ITC"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355741"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557122"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266205"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2002.1181727"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2009.56"}],"event":{"name":"2015 IEEE International Test Conference (ITC)","location":"Anaheim, CA, USA","start":{"date-parts":[[2015,10,6]]},"end":{"date-parts":[[2015,10,8]]}},"container-title":["2015 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7331771\/7342364\/07342383.pdf?arnumber=7342383","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T22:04:18Z","timestamp":1490393058000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7342383\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/test.2015.7342383","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}