{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T18:25:31Z","timestamp":1725387931402},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/test.2015.7342392","type":"proceedings-article","created":{"date-parts":[[2015,12,3]],"date-time":"2015-12-03T16:11:39Z","timestamp":1449159099000},"page":"1-10","source":"Crossref","is-referenced-by-count":0,"title":["eRNA: Refining of reconstructed digital waveform"],"prefix":"10.1109","author":[{"given":"Hideo","family":"Okawara","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651883"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401592"},{"key":"ref6","article-title":"Mixed Signal Lecture Series: DSP-Based Testing - Fundamentals 30 Jitter Injection","author":"okawara","year":"2010","journal-title":"Verigy GoSemi Newsletter"},{"key":"ref5","first-page":"17","article-title":"An Engineer's Guide to Automated Testing of High-speed Interfaces","author":"moreira","year":"2010","journal-title":"Artech House"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651883"},{"key":"ref2","article-title":"Data Analysis on PinScale3600","author":"liu","year":"2006","journal-title":"Presentation of VOICE 2006 (User Group Meeting) Agilent Technology"},{"key":"ref1","first-page":"172","article-title":"An Engineer's Guide to Automated Testing of High-speed Interfaces","author":"moreira","year":"2010","journal-title":"Artech House"}],"event":{"name":"2015 IEEE International Test Conference (ITC)","start":{"date-parts":[[2015,10,6]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2015,10,8]]}},"container-title":["2015 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7331771\/7342364\/07342392.pdf?arnumber=7342392","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,25]],"date-time":"2017-03-25T00:58:41Z","timestamp":1490403521000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7342392\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/test.2015.7342392","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}