{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T23:09:51Z","timestamp":1729638591368,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/test.2015.7342409","type":"proceedings-article","created":{"date-parts":[[2015,12,3]],"date-time":"2015-12-03T21:11:39Z","timestamp":1449177099000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["Testing methods for quaternary content addressable memory using charge-sharing sensing scheme"],"prefix":"10.1109","author":[{"given":"Hao-Yu","family":"Yang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rei-Fu","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chin-Lung","family":"Su","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kuan-Hong","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hang-Kaung","family":"Shu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chi-Wei","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mango C.-T.","family":"Chao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2158703"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1998.706788"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2003.1249424"},{"journal-title":"Sensing Circuit for Single Bit-line Semiconductor Memory Sevice US Patent","year":"2005","author":"huang","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2005.1466131"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.878206"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.884415"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060134"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355536"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.18"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.831433"},{"key":"ref3","first-page":"1788","article-title":"Use of Selective Precharge for Low-power Content-addressable Memories","volume":"3","author":"charleszukowski","year":"1997","journal-title":"IEEE International Symposium on Circuits and Systems"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2163205"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"83","DOI":"10.1109\/ESSCIRC.2011.6044920","article-title":"A 128* 128b High-speed Wide-and Match-line Content Addressable Memory in 32nm CMOS","author":"agarwal","year":"2011","journal-title":"European Solid-State Circuits Conference (ESSCIRC)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2002551"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000247"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2178276"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.818139"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2037995"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2017903"},{"key":"ref22","article-title":"Parameterizable Content-Addressable Memory","author":"locke","year":"2011","journal-title":"Xilinx"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.196"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.252"}],"event":{"name":"2015 IEEE International Test Conference (ITC)","start":{"date-parts":[[2015,10,6]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2015,10,8]]}},"container-title":["2015 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7331771\/7342364\/07342409.pdf?arnumber=7342409","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T00:59:00Z","timestamp":1498265940000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7342409\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/test.2015.7342409","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}