{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:14:14Z","timestamp":1730301254990,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/test.2015.7342418","type":"proceedings-article","created":{"date-parts":[[2015,12,3]],"date-time":"2015-12-03T21:11:39Z","timestamp":1449177099000},"page":"1-8","source":"Crossref","is-referenced-by-count":7,"title":["Secure design-for-debug for Systems-on-Chip"],"prefix":"10.1109","author":[{"given":"Jerry","family":"Backer","sequence":"first","affiliation":[]},{"given":"David","family":"Hely","sequence":"additional","affiliation":[]},{"given":"Ramesh","family":"Karri","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"1338","article-title":"Trace Signal Selection for Visibility Enhancement in Post-Silicon Validation","author":"liu","year":"2009","journal-title":"Design Automation & Test in Europe Conference & Exhibition"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2004.87"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/871506.871512"},{"key":"ref13","first-page":"9","article-title":"Physical Unclonable Functions for Device Authentication and Key Generation","author":"suh","year":"2007","journal-title":"ACM\/EDA\/DAC\/IEEE Annual Design Automation Conference"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346548"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.25"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MSE.2009.5270820"},{"year":"2008","key":"ref17","article-title":"Encounter User Guide"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1998.727055"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"year":"2015","key":"ref4","article-title":"Intel Trace Hub, Developer's Manual"},{"year":"2011","key":"ref3","article-title":"CoreSight Program Flow Trace PFTv1.0 and PFTv 1.1 Architecture, Specification"},{"key":"ref6","article-title":"Embedded Devices Security Firmware Reverse Engineering","author":"zaddach","year":"2013","journal-title":"BlackHat USA"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1086297.1086308"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.9"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5369-9"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-06242-6"},{"article-title":"On-chip System Level Visibility. How to Optimise ARM Platforms & Shorten Time To Market?","year":"2010","author":"poublan","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2208209"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2013.2279798"},{"key":"ref22","first-page":"632","article-title":"Combined Modeling and Side Channel Attacks on Strong PUFs","volume":"2013","author":"mahmoud","year":"2013","journal-title":"IACR Cryptology ePrint Archive"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.859470"}],"event":{"name":"2015 IEEE International Test Conference (ITC)","start":{"date-parts":[[2015,10,6]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2015,10,8]]}},"container-title":["2015 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7331771\/7342364\/07342418.pdf?arnumber=7342418","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T21:40:17Z","timestamp":1490391617000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7342418\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2015.7342418","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}