{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T09:22:12Z","timestamp":1725528132833},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/test.2015.7342420","type":"proceedings-article","created":{"date-parts":[[2015,12,3]],"date-time":"2015-12-03T21:11:39Z","timestamp":1449177099000},"page":"1-10","source":"Crossref","is-referenced-by-count":4,"title":["Test-access-mechanism optimization for multi-Vdd SoCs"],"prefix":"10.1109","author":[{"given":"Fotios","family":"Vartziotis","sequence":"first","affiliation":[]},{"given":"Xrysovalantis","family":"Kavousianos","sequence":"additional","affiliation":[]},{"given":"Panagiotis","family":"Georgiou","sequence":"additional","affiliation":[]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"9","article-title":"Design Issues for Dynamic Voltage Scaling","author":"burd","year":"2000","journal-title":"Proc of ISLPED 2000"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/371254.371258"},{"key":"ref12","first-page":"30","article-title":"A low-cost and scalable test architncture for multi-core chips","author":"chi","year":"2010","journal-title":"Proc 15th IEEE ETS"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.169"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/944027.944029"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041747"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966728"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011146"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2203600"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2013540"},{"journal-title":"Intel PXA270","year":"0","key":"ref4"},{"journal-title":"Crusoe Processor Documentation 2002","article-title":"Transmeta Corporation","year":"0","key":"ref3"},{"key":"ref6","doi-asserted-by":"crossref","DOI":"10.1002\/9780470594001","author":"agresti","year":"2010","journal-title":"Analysis of Ordinal Categorical Data"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484684"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2017437"},{"key":"ref7","first-page":"15","article-title":"Dynamic Voltage Scaling Aware Delay Fault Testing","author":"ali","year":"2006","journal-title":"11th IEEE ETS"},{"journal-title":"Intel Corp Intel Scale Core Developer's Manual","year":"2003","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035292"},{"journal-title":"ARM 1176JZ(F)-S Documentation","year":"0","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923247"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1252857"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041804"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1261388"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139171"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364596"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2394462"}],"event":{"name":"2015 IEEE International Test Conference (ITC)","start":{"date-parts":[[2015,10,6]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2015,10,8]]}},"container-title":["2015 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7331771\/7342364\/07342420.pdf?arnumber=7342420","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T00:59:00Z","timestamp":1498265940000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7342420\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/test.2015.7342420","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}