{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T14:58:42Z","timestamp":1725721122033},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805817","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T17:22:46Z","timestamp":1483636966000},"page":"10-10","source":"Crossref","is-referenced-by-count":0,"title":["Keynote address Wednesday: Hardware inference accelerators for machine learning"],"prefix":"10.1109","author":[{"given":"Rob A.","family":"Rutenbar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2016 IEEE International Test Conference (ITC)","start":{"date-parts":[[2016,11,15]]},"location":"Fort Worth, TX, USA","end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805817.pdf?arnumber=7805817","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T17:23:15Z","timestamp":1483636995000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805817\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805817","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}