{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,14]],"date-time":"2025-06-14T04:09:21Z","timestamp":1749874161956,"version":"3.41.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805822","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T22:22:46Z","timestamp":1483654966000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors"],"prefix":"10.1109","author":[{"given":"Subhadip","family":"Kundu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Parthajit","family":"Bhattacharya","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rohit","family":"Kapur","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090896"},{"journal-title":"VLSI Test Principles and Architectures Design for Testability","year":"2006","author":"wang","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/54.32421"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1983.1585651"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/196244.196358"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/43.370421"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"660","DOI":"10.1145\/309847.310021","article-title":"Multiple error diagnosis based on xlists","author":"boppana","year":"1999","journal-title":"Proceedings of the 36th Annual ACM\/IEEE Design Automation Conference"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"503","DOI":"10.1145\/157485.165003","article-title":"diagnosis and correction of logic design errors in digital circuits","author":"chung","year":"1993","journal-title":"30th ACM\/IEEE Design Automation Conference"},{"key":"ref18","first-page":"34","article-title":"On Improving the Accuracy of Multiple Defect Diagnosis","author":"huang","year":"2001","journal-title":"Proc IEEE 19th VLSI Test Symp"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270904"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.823341"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386986"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.844111"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.891361"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583998"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512644"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114067"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0602"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2533444"}],"event":{"name":"2016 IEEE International Test Conference (ITC)","start":{"date-parts":[[2016,11,15]]},"location":"Fort Worth, TX, USA","end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805822.pdf?arnumber=7805822","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,14]],"date-time":"2025-06-14T01:38:46Z","timestamp":1749865126000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805822\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805822","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}