{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:29:36Z","timestamp":1781886576659,"version":"3.54.5"},"reference-count":48,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805826","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T22:22:46Z","timestamp":1483654966000},"page":"1-10","source":"Crossref","is-referenced-by-count":20,"title":["Test point insertion in hybrid test compression\/LBIST architectures"],"prefix":"10.1109","author":[{"given":"Elham","family":"Moghaddam","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nilanjan","family":"Mukherjee","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jerzy","family":"Tyszer","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Justyna","family":"Zawada","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557122"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"},{"key":"ref32","article-title":"De-compressor\/PRPG for applying pseudo-random and deterministic test patterns","author":"rajski","year":"2004"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1997.643983"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114081"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.260953"},{"key":"ref36","first-page":"253","article-title":"Test point insertion for scan-based BIST","author":"seiss","year":"1991","journal-title":"Proc ETC"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2002.1106816"},{"key":"ref34","first-page":"385","article-title":"ATPG heuristics dependent observation point insertion for enhanced compaction and data volume reduction","author":"romersaro","year":"2008","journal-title":"Proc DFTVS"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585245"},{"key":"ref40","first-page":"2","article-title":"Transformed pseudorandom patterns for BIST","author":"touba","year":"1995","journal-title":"Proc VTS"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.43"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437611"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2323216"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894274"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1995.479997"},{"key":"ref17","article-title":"Understanding ISO 26262 ASILs","author":"hobbs","year":"2013","journal-title":"Electronic Design"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990313"},{"key":"ref19","first-page":"501","article-title":"Synthesis of pseudorandom pattern testable designs","author":"iyengar","year":"1989","journal-title":"Proc ITC"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831593"},{"key":"ref4","first-page":"274","article-title":"Random pattern testability by fault simulation","author":"briers","year":"1986","journal-title":"Proc ITC"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882509"},{"key":"ref3","first-page":"705","article-title":"Applications of testability analysis: from ATPG to critical delay path tracing","author":"brglez","year":"1984","journal-title":"Proc ITC"},{"key":"ref6","first-page":"506","article-title":"Timing-driven test point insertion for full-scan and partial-scan BIST","author":"cheng","year":"0","journal-title":"Proc ITC 1995"},{"key":"ref29","first-page":"894","article-title":"Two-dimensional test data compression for scan-based deterministic BIST","author":"liang","year":"2001","journal-title":"Proc ITC"},{"key":"ref5","first-page":"658","article-title":"A novel combinational testability analysis by considering signal correlation","author":"chang","year":"1998","journal-title":"Proc ITC"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041754"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2126574"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033794"},{"key":"ref9","first-page":"48","article-title":"Efficient pattern mapping for deterministic logic BIST","author":"gherman","year":"2004","journal-title":"Proc ITC"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342383"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/43.55187"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837985"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584057"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2002.1181727"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/43.511581"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569803"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.40"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266205"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744817"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/43.918212"},{"key":"ref23","first-page":"237","article-title":"LFSR-coded test patterns for scan designs","author":"koenemann","year":"1991","journal-title":"Proc ETC"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775976"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250115"},{"key":"ref43","first-page":"581","article-title":"Test data compression for IP embedded cores using selective encoding of scan slices","author":"wang","year":"2005","journal-title":"Proc ITC"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041775"}],"event":{"name":"2016 IEEE International Test Conference (ITC)","location":"Fort Worth, TX, USA","start":{"date-parts":[[2016,11,15]]},"end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805826.pdf?arnumber=7805826","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T04:59:39Z","timestamp":1484974779000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805826\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":48,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805826","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}