{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T15:50:51Z","timestamp":1780501851223,"version":"3.54.1"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805829","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T17:22:46Z","timestamp":1483636966000},"page":"1-9","source":"Crossref","is-referenced-by-count":21,"title":["Analog fault coverage improvement using final-test dynamic part average testing"],"prefix":"10.1109","author":[{"given":"Wim","family":"Dobbelaere","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ronny","family":"Vanhooren","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Willy","family":"De Man","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Koen","family":"Matthijs","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Anthony","family":"Coyette","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Baris","family":"Esen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Georges","family":"Gielen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Dynamic Part Average Testing for Automotive IC Final Testing","author":"dobbelaere","year":"2015","journal-title":"IEEE International Test Conference PO 2 6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457143"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2205480"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297691"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763135"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2206552"},{"key":"ref16","article-title":"Process Variations and Probabilistic Integrated Circuit Design","author":"dietrich","year":"2011","journal-title":"Springer Science & Business Media"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.07.006"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2008.08.018"},{"key":"ref19","year":"2003"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2015.7177867"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2210852"},{"key":"ref6","article-title":"Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits","volume":"17","author":"bushnell","year":"2000","journal-title":"Springer Science & Business Media"},{"key":"ref5","article-title":"Defect oriented testing for CMOS analog and digital circuits","author":"sachdev","year":"1998","journal-title":"Kluwer Academic Publishers"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116275"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847817"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035330"},{"key":"ref1","article-title":"Analog Fault Coverage Improvement Using Defect-Specific Masking","author":"dobbelaere","year":"2014","journal-title":"VOICE Santa Clara"},{"key":"ref9","article-title":"Method to improve analog fault coverage","author":"esen","year":"0","journal-title":"patent pending"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.10"}],"event":{"name":"2016 IEEE International Test Conference (ITC)","location":"Fort Worth, TX, USA","start":{"date-parts":[[2016,11,15]]},"end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805829.pdf?arnumber=7805829","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T00:15:11Z","timestamp":1484957711000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805829\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805829","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}