{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T16:45:10Z","timestamp":1776530710960,"version":"3.51.2"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805830","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T17:22:46Z","timestamp":1483636966000},"page":"1-9","source":"Crossref","is-referenced-by-count":21,"title":["Effective DC fault models and testing approach for open defects in analog circuits"],"prefix":"10.1109","author":[{"given":"Baris","family":"Esen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anthony","family":"Coyette","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georges","family":"Gielen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wim","family":"Dobbelaere","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ronny","family":"Vanhooren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035280"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.177407"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/43.905680"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.265677"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008388903741"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998252"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1986.22576"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1999.823874"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/16.249437"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2013.6548889"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035330"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766670"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2015.7301706"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.760378"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139127"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894231"},{"key":"ref1","article-title":"Analog fault coverage improvement using defect-specific masking","author":"dobbelaere","year":"2014","journal-title":"VOICE conference"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.905240"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2002.1187219"},{"key":"ref22","first-page":"385","article-title":"Operation and modeling of the MOS transistor","author":"tsividis","year":"1999"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/16.981221"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557076"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584001"}],"event":{"name":"2016 IEEE International Test Conference (ITC)","location":"Fort Worth, TX, USA","start":{"date-parts":[[2016,11,15]]},"end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805830.pdf?arnumber=7805830","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T00:00:18Z","timestamp":1484956818000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805830\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805830","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}