{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T10:36:53Z","timestamp":1752230213736},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805837","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T22:22:46Z","timestamp":1483654966000},"source":"Crossref","is-referenced-by-count":7,"title":["Statistical outlier screening as a test solution health monitor"],"prefix":"10.1109","author":[{"given":"David","family":"Shaw","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dirk","family":"Hoops","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kenneth M.","family":"Butler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amit","family":"Nahar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Semiconductor Outlier Identification Using Serially-Combined Data Transform Processing Methodologies","author":"nahar","year":"2012"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011113"},{"key":"ref12","first-page":"125","article-title":"ATE hardware diagnostics, fault detection, and fault isolation tool (self-test adapter)","author":"lambrecht","year":"1998","journal-title":"AUTOTESTCON '88"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2028623"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805844"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2015.7224358"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2009.5413175"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.38"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401547"},{"key":"ref8","article-title":"Method for Test Data-Driven Statistical Detection of Outlier Semiconductor Devices","author":"subramaniam","year":"2006"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251278"},{"key":"ref2","first-page":"92","article-title":"Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data","author":"daasch","year":"2001","journal-title":"Proc 2001 IEEE Int Test Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531962"},{"key":"ref9","article-title":"Identification of Outlier Semiconductor Devices Using Data-Driven Statistical Characterization","author":"subramaniam","year":"2009"}],"event":{"name":"2016 IEEE International Test Conference (ITC)","location":"Fort Worth, TX, USA","start":{"date-parts":[[2016,11,15]]},"end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805837.pdf?arnumber=7805837","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T05:11:54Z","timestamp":1484975514000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805837\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805837","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}