{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T13:27:38Z","timestamp":1775482058038,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805843","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T22:22:46Z","timestamp":1483654966000},"page":"1-9","source":"Crossref","is-referenced-by-count":11,"title":["Low cost ultra-pure sine wave generation with self calibration"],"prefix":"10.1109","author":[{"given":"Yuming","family":"Zhuang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Akhilesh Kesavan","family":"Unnithan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arun","family":"Joseph","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siva","family":"Sudani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benjamin","family":"Magstadt","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Degang","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700607"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035304"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2043885"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2249178"},{"key":"ref14","author":"sudani","year":"2013","journal-title":"Accurate spectral test algorithms with relaxed instrumentation requirements"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477282"},{"key":"ref4","article-title":"IEEE Standard for Digitizing Waveform Recorders","year":"2007"},{"key":"ref3","article-title":"IEEE Standard for Terminology and Test Methods for Analz-to-Digital Converters","year":"2010"},{"key":"ref6","article-title":"Precision Data Converter Test Module for X-Series (DCTM)","year":"2012"},{"key":"ref5","article-title":"APx555 audio analyzer Installation Instructions and Specifications","year":"2014"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2267473"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139176"},{"key":"ref2","article-title":"Data Conversion Handbook","author":"kester","year":"2004"},{"key":"ref1","article-title":"An Introduction to Mixed-Signal IC Test and Measurement","author":"burns","year":"2012"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.834079"}],"event":{"name":"2016 IEEE International Test Conference (ITC)","location":"Fort Worth, TX, USA","start":{"date-parts":[[2016,11,15]]},"end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805843.pdf?arnumber=7805843","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T04:52:18Z","timestamp":1484974338000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805843\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805843","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}