{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T15:25:49Z","timestamp":1725809149818},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805844","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T17:22:46Z","timestamp":1483636966000},"page":"1-8","source":"Crossref","is-referenced-by-count":10,"title":["What we know after twelve years developing and deploying test data analytics solutions"],"prefix":"10.1109","author":[{"given":"Kenneth M.","family":"Butler","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amit","family":"Nahar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W. Robert","family":"Daasch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011113"},{"article-title":"Method for Test Data-Driven Statistical Detection of Outlier Semiconductor Devices","year":"2006","author":"subramaniam","key":"ref11"},{"article-title":"Identification of Outlier Semiconductor Devices Using Data-Driven Statistical Characterization","year":"2009","author":"subramaniam","key":"ref12"},{"article-title":"Semiconductor Outlier Identification Using Serially-Combined Data Transform Processing Methodologies","year":"2012","author":"nahar","key":"ref13"},{"key":"ref14","first-page":"189","article-title":"Test generation and dynamic compaction of tests","author":"goel","year":"1979","journal-title":"IEEE Test Symposium"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/03610927708827533"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251278"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355643"},{"key":"ref18","article-title":"Statistical Outlier Screening As A Test Solution Health Monitoring System","author":"shaw","year":"2016","journal-title":"IEEE International Test Conference"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894324"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355643"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583989"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2596675"},{"key":"ref8","first-page":"427","article-title":"The Elements of Statistical Learning: Data Mining, Inference and Prediction","author":"hastie","year":"2009"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966622"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437700"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.913191"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700605"}],"event":{"name":"2016 IEEE International Test Conference (ITC)","start":{"date-parts":[[2016,11,15]]},"location":"Fort Worth, TX, USA","end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805844.pdf?arnumber=7805844","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T15:52:36Z","timestamp":1513180356000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805844\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805844","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}