{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T11:18:38Z","timestamp":1725621518369},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/test.2016.7805852","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T17:22:46Z","timestamp":1483636966000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["Mixed-signal ATE technology and its impact on today's electronic system"],"prefix":"10.1109","author":[{"given":"Gordon W.","family":"Roberts","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Multirate Systems and Filter Banks","year":"1993","author":"vaidyanathan","key":"ref4"},{"journal-title":"DSP-Based Testing of Analog and Mixed-Signal Circuits","year":"1987","author":"mahoney","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/el:20060561"},{"key":"ref10","article-title":"What Can A Built In CPU Do For The Mixed Signal Test Engineer","author":"yehle","year":"2015","journal-title":"Teradyne Users Group Meeting"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/30.468055"},{"journal-title":"1687–2014 - IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device","year":"0","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342395"},{"journal-title":"Std 1149 4–1999 IEEE Standard for a Mixed Signal Test Bus IEEE","year":"0","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470682"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-10419-0_2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/49.761034"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894316"}],"event":{"name":"2016 IEEE International Test Conference (ITC)","start":{"date-parts":[[2016,11,15]]},"location":"Fort Worth, TX, USA","end":{"date-parts":[[2016,11,17]]}},"container-title":["2016 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794484\/7805805\/07805852.pdf?arnumber=7805852","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,20]],"date-time":"2017-01-20T23:43:07Z","timestamp":1484955787000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805852\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/test.2016.7805852","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}