{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T20:26:44Z","timestamp":1725740804083},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/test.2017.8242030","type":"proceedings-article","created":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T21:33:50Z","timestamp":1514842430000},"page":"1-8","source":"Crossref","is-referenced-by-count":3,"title":["Low cost dynamic error detection in linearity testing of SAR ADCs"],"prefix":"10.1109","author":[{"given":"Nimit","family":"Jain","sequence":"first","affiliation":[]},{"given":"Nitin","family":"Agarwal","sequence":"additional","affiliation":[]},{"given":"Rajavelu","family":"Thinakaran","sequence":"additional","affiliation":[]},{"given":"Rubin","family":"Parekhji","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2562198"},{"key":"ref11","first-page":"556","article-title":"On the use of redundancy in successive approximation AID converters","author":"murmann","year":"2013","journal-title":"Proc Int Conf Sampling Theory Appl"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433970"},{"journal-title":"Practical Optimization","year":"1981","author":"gill","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270842"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.809775"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/81.645145"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297679"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583979"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401561"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"},{"journal-title":"An Introduction to Mixed-Signal IC Test and Measurement","year":"2001","author":"burns","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2015.2442372"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116249"}],"event":{"name":"2017 IEEE International Test Conference (ITC)","start":{"date-parts":[[2017,10,31]]},"location":"Fort Worth, TX","end":{"date-parts":[[2017,11,2]]}},"container-title":["2017 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8227522\/8242015\/08242030.pdf?arnumber=8242030","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,25]],"date-time":"2022-01-25T23:38:06Z","timestamp":1643153886000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8242030\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/test.2017.8242030","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}