{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T13:04:43Z","timestamp":1762002283550,"version":"build-2065373602"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/test.2017.8242032","type":"proceedings-article","created":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T16:33:50Z","timestamp":1514824430000},"page":"1-10","source":"Crossref","is-referenced-by-count":10,"title":["An on-chip ADC BIST solution and the BIST enabled calibration scheme"],"prefix":"10.1109","author":[{"given":"Xiankun","family":"Jin","sequence":"first","affiliation":[]},{"given":"Tao","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Mayank","family":"Jain","sequence":"additional","affiliation":[]},{"given":"Arun Kumar","family":"Barman","sequence":"additional","affiliation":[]},{"given":"David","family":"Kramer","sequence":"additional","affiliation":[]},{"given":"Doug","family":"Garrity","sequence":"additional","affiliation":[]},{"given":"Randall","family":"Geiger","sequence":"additional","affiliation":[]},{"given":"Degang","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.807795"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.831508"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.851057"},{"key":"ref13","first-page":"792","article-title":"Pipeline ADC Linearity Testing with Dramatically Reduced Data Capture Time","author":"yu","year":"2005","journal-title":"proceedings of IEEE International Symposium on Circuits and Systems"},{"key":"ref14","first-page":"1","article-title":"Linearity Test of A\/D Converters Using Kalman Filtering","author":"jin","year":"0","journal-title":"IEEE International Test Conference Paper 28 3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5538006"},{"key":"ref16","article-title":"Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements","author":"kook","year":"2012","journal-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5538005"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583979"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.48"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2163556"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2012.6271677"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052231"},{"journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","first-page":"1","year":"2011","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.807415"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2123590"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923449"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2015.7177876"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805804"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.904491"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"2011","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/APCCAS.2010.5774755"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116249"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401561"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON.2009.5426617"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1964.1088973"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865121"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2009.5117673"}],"event":{"name":"2017 IEEE International Test Conference (ITC)","start":{"date-parts":[[2017,10,31]]},"location":"Fort Worth, TX","end":{"date-parts":[[2017,11,2]]}},"container-title":["2017 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8227522\/8242015\/08242032.pdf?arnumber=8242032","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,5]],"date-time":"2018-02-05T17:35:18Z","timestamp":1517852118000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8242032\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/test.2017.8242032","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}