{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:14:25Z","timestamp":1730301265438,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/test.2017.8242042","type":"proceedings-article","created":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T21:33:50Z","timestamp":1514842430000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Cognitive approach to support dynamic aging compensation"],"prefix":"10.1109","author":[{"given":"S.","family":"Mhira","sequence":"first","affiliation":[]},{"given":"V.","family":"Huard","sequence":"additional","affiliation":[]},{"given":"A.","family":"Benhassain","sequence":"additional","affiliation":[]},{"given":"F.","family":"Cacho","sequence":"additional","affiliation":[]},{"given":"D.","family":"Meyer","sequence":"additional","affiliation":[]},{"given":"S.","family":"Naudet","sequence":"additional","affiliation":[]},{"given":"A.","family":"Jain","sequence":"additional","affiliation":[]},{"given":"C.","family":"Parthasarathy","sequence":"additional","affiliation":[]},{"given":"A.","family":"Bravaix","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","volume":"3a 5","author":"huard","year":"2013","journal-title":"IEEE International Reliability Physics Symposium"},{"year":"0","key":"ref11"},{"key":"ref12","article-title":"Adaptive Resonance Theory","author":"carpenter","year":"1998","journal-title":"The Handbook of Brain Theory and Neural Networks"},{"key":"ref13","volume":"3a 4","author":"mhira","year":"2017","journal-title":"IEEE International Reliability Physics Symposium"},{"journal-title":"IEEE International Reliability Physics Symposium","year":"2015","author":"mora","key":"ref14"},{"journal-title":"IEEE International Reliability Physics Symposium","year":"2011","author":"kwasnick","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1974.1050511"},{"journal-title":"IEEE Custom Integrated Circuits Conference","year":"2015","author":"benhassain","key":"ref6"},{"journal-title":"IEEE International Reliability Physics Symposium","year":"2017","author":"huard","key":"ref5"},{"key":"ref8","volume":"3a 1","author":"mintarno","year":"2013","journal-title":"IEEE International Reliability Physics Symposium"},{"journal-title":"Proceedings of the IEEE\/ACM DATE conference","year":"2015","author":"saliva","key":"ref7"},{"journal-title":"ITRS 2010 Update","year":"2011","key":"ref2"},{"key":"ref1","volume":"38","author":"moore","year":"1965","journal-title":"Electronics"},{"key":"ref9","volume":"3e 5","author":"huard","year":"2013","journal-title":"IEEE International Reliability Physics Symposium"}],"event":{"name":"2017 IEEE International Test Conference (ITC)","start":{"date-parts":[[2017,10,31]]},"location":"Fort Worth, TX","end":{"date-parts":[[2017,11,2]]}},"container-title":["2017 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8227522\/8242015\/08242042.pdf?arnumber=8242042","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,5]],"date-time":"2018-02-05T22:35:21Z","timestamp":1517870121000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8242042\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/test.2017.8242042","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}