{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,13]],"date-time":"2026-05-13T17:45:12Z","timestamp":1778694312230,"version":"3.51.4"},"reference-count":32,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/test.2017.8242062","type":"proceedings-article","created":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T16:33:50Z","timestamp":1514824430000},"page":"1-10","source":"Crossref","is-referenced-by-count":52,"title":["Hardware trojan detection through information flow security verification"],"prefix":"10.1109","author":[{"given":"Adib","family":"Nahiyan","sequence":"first","affiliation":[]},{"given":"Mehdi","family":"Sadi","sequence":"additional","affiliation":[]},{"given":"Rahul","family":"Vittal","sequence":"additional","affiliation":[]},{"given":"Gustavo","family":"Contreras","sequence":"additional","affiliation":[]},{"given":"Domenic","family":"Forte","sequence":"additional","affiliation":[]},{"given":"Mark","family":"Tehranipoor","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref32","year":"0"},{"key":"ref31","doi-asserted-by":"crossref","DOI":"10.1145\/2897937.2897992","article-title":"AVFSM: a framework for identifying and mitigating vulnerabilities in fsms","author":"nahiyan","year":"2016","journal-title":"DAC"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537093"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516654"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488808"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2660267.2660289"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2017.7858388"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744823"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2016.143"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581573"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2747939"},{"key":"ref18","year":"2014","journal-title":"JasperGold Security Path Verification App"},{"key":"ref19","first-page":"44","article-title":"Detecting hardware trojans with gate-level information-flow tracking","volume":"49 8","author":"wei","year":"2016","journal-title":"Computer"},{"key":"ref28","year":"0","journal-title":"Desing Compiler"},{"key":"ref4","author":"salmani","year":"2013","journal-title":"Integrated Circuit Authentication Hardware Trojans and Counterfeit Detection"},{"key":"ref27","article-title":"Security Vulnerability Analysis of Design-for-Test Exploits for Asset Protection in SoCs","author":"contreras","year":"2017","journal-title":"ASP-DAC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653605"},{"key":"ref29","year":"0","journal-title":"TetraMAX"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5954998"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2010.18"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2013.6657085"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-49025-0_4"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2011.32"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2906147"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2676548"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2016.226"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2013.6657085"},{"key":"ref24","year":"1997","journal-title":"VSI Alliance VSI Alliance Architecture Document Version 1 0"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-49025-0_2"},{"key":"ref26","author":"scheffer","year":"2016","journal-title":"EDA for IC System Design Verification and Testing"},{"key":"ref25","year":"0","journal-title":"Inclusive formal verification (IFV)"}],"event":{"name":"2017 IEEE International Test Conference (ITC)","location":"Fort Worth, TX","start":{"date-parts":[[2017,10,31]]},"end":{"date-parts":[[2017,11,2]]}},"container-title":["2017 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8227522\/8242015\/08242062.pdf?arnumber=8242062","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,25]],"date-time":"2022-01-25T22:47:57Z","timestamp":1643150877000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8242062\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/test.2017.8242062","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}