{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T11:26:07Z","timestamp":1763724367612},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/test.2017.8242079","type":"proceedings-article","created":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T21:33:50Z","timestamp":1514842430000},"page":"1-7","source":"Crossref","is-referenced-by-count":25,"title":["A\/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods"],"prefix":"10.1109","author":[{"given":"Stephen","family":"Sunter","sequence":"first","affiliation":[]},{"given":"Peter","family":"Sarson","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639612"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035330"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342395"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIR.2005.1541583"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SECON.1999.766127"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699243"},{"key":"ref12","article-title":"A Publicly-Accessible Set of A\/MS Benchmark Circuits","author":"sunter","year":"2017","journal-title":"Emerging Test Strategies Session 3 presented at European Test Symp"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2717764.2717783"},{"year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"journal-title":"presented at European Test Symp","article-title":"A framework for automation in analog\/mixed-signal DfT and test","year":"2015","key":"ref9"},{"key":"ref1","first-page":"693","article-title":"Accelerated ATPG and Fault Grading via Testability Analysis","author":"brglez","year":"1985","journal-title":"Proc of International Symp on Circuits and Systems"}],"event":{"name":"2017 IEEE International Test Conference (ITC)","start":{"date-parts":[[2017,10,31]]},"location":"Fort Worth, TX","end":{"date-parts":[[2017,11,2]]}},"container-title":["2017 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8227522\/8242015\/08242079.pdf?arnumber=8242079","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,5]],"date-time":"2018-02-05T22:35:12Z","timestamp":1517870112000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8242079\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/test.2017.8242079","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}