{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T20:25:37Z","timestamp":1725395137155},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/test.2018.8624678","type":"proceedings-article","created":{"date-parts":[[2019,1,25]],"date-time":"2019-01-25T03:09:16Z","timestamp":1548385756000},"page":"1-10","source":"Crossref","is-referenced-by-count":2,"title":["Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run"],"prefix":"10.1109","author":[{"given":"Yi-Cheng","family":"Kung","sequence":"first","affiliation":[]},{"given":"Kuen-Jong","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Sudhakar M.","family":"Reddy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653611"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.36"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783735"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.6"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.870836"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805866"},{"key":"ref16","article-title":"Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run","author":"kung","year":"2018","journal-title":"accepted International Test Conference in Asia"},{"year":"0","key":"ref17","article-title":"Tessent ATPG User Guide, Version J-2015.02"},{"year":"0","key":"ref18","article-title":"Modus ATPG User Guide, Version 17.20"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700648"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292299"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700642"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2217360"},{"key":"ref8","first-page":"400","article-title":"On detecting bridges causing timing failures","author":"chakravarty","year":"1999","journal-title":"Proc ICCD"},{"key":"ref7","first-page":"1","article-title":"Efficient SMTbased ATPG for interconnect open defects","author":"erb","year":"2014","journal-title":"Proc Design Automation & Test in Europe Conference & Exhibition"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.238615"},{"journal-title":"VLSI Test Principles and Architectures Design for Testability","year":"2006","author":"wang","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.16"}],"event":{"name":"2018 IEEE International Test Conference (ITC)","start":{"date-parts":[[2018,10,29]]},"location":"Phoenix, AZ, USA","end":{"date-parts":[[2018,11,1]]}},"container-title":["2018 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610502\/8624670\/08624678.pdf?arnumber=8624678","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T22:50:21Z","timestamp":1643237421000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624678\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2018.8624678","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}