{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T00:49:53Z","timestamp":1768351793447,"version":"3.49.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/test.2018.8624679","type":"proceedings-article","created":{"date-parts":[[2019,1,25]],"date-time":"2019-01-25T03:09:16Z","timestamp":1548385756000},"page":"1-9","source":"Crossref","is-referenced-by-count":13,"title":["EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs"],"prefix":"10.1109","author":[{"given":"Andrew","family":"Stern","sequence":"first","affiliation":[]},{"given":"Ulbert","family":"Botero","sequence":"additional","affiliation":[]},{"given":"Bicky","family":"Shakya","sequence":"additional","affiliation":[]},{"given":"Haoting","family":"Shen","sequence":"additional","affiliation":[]},{"given":"Domenic","family":"Forte","sequence":"additional","affiliation":[]},{"given":"Mark","family":"Tehranipoor","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495581"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805854"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062249"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.07.008"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855574"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2016.7783762"},{"key":"ref16","article-title":"Electromagnetic side-channel analysis for hardware and software watermarking","author":"lakshminarasimhan","year":"2011","journal-title":"Master thesis"},{"key":"ref17","first-page":"29","author":"agrawal","year":"2003","journal-title":"The EM Side—Channel(s)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495572"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2008.2008907"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2013.28"},{"key":"ref3","first-page":"15","article-title":"Counterfeit integrated circuits","author":"tehranipoor","year":"2015","journal-title":"Counterfeit Integrated Circuits"},{"key":"ref6","first-page":"9","article-title":"Physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"Proceedings of the 44th Annual Conference on Design Automation-DAC"},{"key":"ref5","article-title":"Traceability in the age of globalization: a proposal for a marking protocol to assure authenticity of electronic parts","author":"miller","year":"2012","journal-title":"Technical report SAE Technical Paper"},{"key":"ref8","first-page":"1","article-title":"A machine learning approach to fab-of-origin attestation","author":"ahmadi","year":"2016","journal-title":"In Computer- Aided Design (ICCAD) 2016 IEEE\/ACM International Conference on"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5430-8"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593157"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"197","DOI":"10.3233\/JEC-2009-0092","article-title":"Clock-tree synthesis for low-emi design","volume":"3","author":"pandini","year":"2009","journal-title":"Journal of Embedded Computing"},{"key":"ref22","year":"0","journal-title":"8-bit Low-Voltage Microcontroller Rev 2601C"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2047281"},{"key":"ref24","article-title":"A tutorial on principal component analysis","author":"shlens","year":"2014","journal-title":"CoRR absI1404 1100"},{"key":"ref23","year":"0","journal-title":"Passive RF Near-Field Probe Rev 1"}],"event":{"name":"2018 IEEE International Test Conference (ITC)","location":"Phoenix, AZ, USA","start":{"date-parts":[[2018,10,29]]},"end":{"date-parts":[[2018,11,1]]}},"container-title":["2018 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610502\/8624670\/08624679.pdf?arnumber=8624679","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T23:00:54Z","timestamp":1643238054000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624679\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/test.2018.8624679","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}