{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T11:27:06Z","timestamp":1763724426924},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/test.2018.8624716","type":"proceedings-article","created":{"date-parts":[[2019,1,24]],"date-time":"2019-01-24T22:09:16Z","timestamp":1548367756000},"page":"1-10","source":"Crossref","is-referenced-by-count":15,"title":["Improving Analog Functional Safety Using Data-Driven Anomaly Detection"],"prefix":"10.1109","author":[{"given":"Fei","family":"Su","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Prashant","family":"Goteti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242043"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242044"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2013.6580237"},{"key":"ref13","article-title":"Federated learning: Strategies for improving communication efficiency","author":"kone?ny","year":"2016","journal-title":"arXiv 1610 05492"},{"journal-title":"Introduction to Statistical Time Series","year":"1996","author":"fuller","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-47578-3"},{"key":"ref16","article-title":"A survey of deep learning-based network anomaly detection","author":"kwon","year":"2017","journal-title":"Cluster Computing"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1541880.1541882"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355542"},{"key":"ref19","article-title":"Semi-supervised sequence learning","author":"dai","year":"2015","journal-title":"Proc Neural Information Processing Systems (NIPS)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805869"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242075"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139178"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2012.6233055"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242047"},{"journal-title":"Automotive Electronics Council AEC-Q001 Rev-D Guidelines for Part Average Testing","year":"2011","key":"ref7"},{"key":"ref2","article-title":"IEEE P2427: Proposing the essential framework for measuring defect coverage in analog circuits","author":"rearick","year":"2018","journal-title":"Proc VLSI Test Symposium"},{"journal-title":"Road Vehicles Functional Safety ISO 26262","year":"0","key":"ref1"},{"key":"ref9","article-title":"Towards predictive fault tolerance in a core-router system: Anomaly detection using correlation-based time-series analysis","author":"jin","year":"2017","journal-title":"IEEE Trans on CAD"}],"event":{"name":"2018 IEEE International Test Conference (ITC)","start":{"date-parts":[[2018,10,29]]},"location":"Phoenix, AZ, USA","end":{"date-parts":[[2018,11,1]]}},"container-title":["2018 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610502\/8624670\/08624716.pdf?arnumber=8624716","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T18:27:35Z","timestamp":1643221655000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624716\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2018.8624716","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}