{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,2]],"date-time":"2026-01-02T07:44:36Z","timestamp":1767339876608},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/test.2018.8624727","type":"proceedings-article","created":{"date-parts":[[2019,1,25]],"date-time":"2019-01-25T03:09:16Z","timestamp":1548385756000},"source":"Crossref","is-referenced-by-count":47,"title":["Hardware IP Trust Validation: Learn (the Untrustworthy), and Verify"],"prefix":"10.1109","author":[{"given":"Tamzidul","family":"Hoque","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jonathan","family":"Cruz","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Prabuddha","family":"Chakraborty","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Swarup","family":"Bhunia","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156139"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5954998"},{"key":"ref12","first-page":"471","article-title":"Hardware Trojan Detection for Gate-Level ICs using Signal Correlation Based Clustering","author":"cakir","year":"2015","journal-title":"DATE"},{"key":"ref13","article-title":"A Score-Based Classification Method for Identifying Hardware-Trojans at Gate-Level Netlists","author":"oya","year":"2015","journal-title":"DATE"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516654"},{"key":"ref15","article-title":"On Design vulnerability analysis and trust benchmark development","author":"salmani","year":"2013","journal-title":"ICCD"},{"key":"ref16","article-title":"MOLES: Malicious Off-Chip Leakage Enabled by Side-Channels","author":"lin","year":"2009","journal-title":"ICCD"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1140123.1140127"},{"key":"ref18","article-title":"An automated configurable Trojan insertion framework for dynamic trust benchmarks","author":"cruz","year":"2018","journal-title":"DATE"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2613842"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046227"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E100.A.1427"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495568"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050827"},{"key":"ref2","article-title":"Toward Integrating Feature Selection Algorithms for Classification and Clustering","author":"liu","year":"2005","journal-title":"TKDE"},{"key":"ref1","article-title":"Semiconductor IP Market to Exceed $8 Billion by 2020, Semico Research Corp","year":"0"},{"key":"ref9","article-title":"Power Profiling of Microcontrollers Instruction Set for Runtime Hardware Trojans Detection without Golden Circuit Models","author":"lodhi","year":"2017","journal-title":"DATE"}],"event":{"name":"2018 IEEE International Test Conference (ITC)","location":"Phoenix, AZ, USA","start":{"date-parts":[[2018,10,29]]},"end":{"date-parts":[[2018,11,1]]}},"container-title":["2018 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610502\/8624670\/08624727.pdf?arnumber=8624727","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T20:16:42Z","timestamp":1704831402000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624727\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2018.8624727","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}