{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:18:17Z","timestamp":1773778697663,"version":"3.50.1"},"reference-count":34,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/test.2018.8624738","type":"proceedings-article","created":{"date-parts":[[2019,1,24]],"date-time":"2019-01-24T22:09:16Z","timestamp":1548367756000},"page":"1-9","source":"Crossref","is-referenced-by-count":19,"title":["XLBIST: X-Tolerant Logic BIST"],"prefix":"10.1109","author":[{"given":"P.","family":"Wohl","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.A.","family":"Waicukauski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.A.","family":"Maston","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.E.","family":"Colburn","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401558"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584057"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775975"},{"key":"ref34","article-title":"X-Masking During Logic BIST and Its Impact on Defect Coverage","author":"tang","year":"2005","journal-title":"Trans VLSI"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386979"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.38"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.81"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197640"},{"key":"ref15","article-title":"X-Codes:Theory and Applications of Unknowable Inputs","author":"lumetta","year":"2003","journal-title":"UIUC Center for Reliable and High-Performance Computing Technical Report CRHC-03–08 (also UILU-ENG-03–2217"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437575"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270904"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584076"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915017"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386988"},{"key":"ref27","first-page":"120","article-title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers","author":"hellebrand","year":"2002","journal-title":"International Test Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297736"},{"key":"ref6","article-title":"Analysis of TestResponse Compaction","author":"pilarski","year":"1995","journal-title":"IEEE Computer Society Press"},{"key":"ref29","first-page":"200","article-title":"A Reseeding Technique for LFSR-Based BIST Applications","author":"lai","year":"0","journal-title":"Asian Test Symposium 2002"},{"key":"ref5","year":"2007","journal-title":"Semiconductor Industry Association"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297662"},{"key":"ref7","author":"bardell","year":"1987","journal-title":"Built-In Test for VLSI Pseudorandom Techniques"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387330"},{"key":"ref9","article-title":"LFSR-Coded Test Patterns for Scan Designs","author":"k\u00f6nemann","year":"1991","journal-title":"Proc of The European Test Conference Munich"},{"key":"ref1","author":"bushnell","year":"2000","journal-title":"Essentials of Electronic Testing"},{"key":"ref20","first-page":"855","article-title":"On compacting test responses data containing unknown values","author":"wang","year":"2003","journal-title":"Proc Int Conf Comput -Aided Design"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1188267"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270902"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837366"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437576"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775976"}],"event":{"name":"2018 IEEE International Test Conference (ITC)","location":"Phoenix, AZ, USA","start":{"date-parts":[[2018,10,29]]},"end":{"date-parts":[[2018,11,1]]}},"container-title":["2018 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610502\/8624670\/08624738.pdf?arnumber=8624738","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T18:01:35Z","timestamp":1643220095000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624738\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/test.2018.8624738","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}