{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T10:21:02Z","timestamp":1725618062067},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/test.2018.8624799","type":"proceedings-article","created":{"date-parts":[[2019,1,25]],"date-time":"2019-01-25T03:09:16Z","timestamp":1548385756000},"page":"1-8","source":"Crossref","is-referenced-by-count":6,"title":["An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs"],"prefix":"10.1109","author":[{"given":"T. -P.","family":"Ho","sequence":"first","affiliation":[]},{"given":"E.","family":"Faehn","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]},{"given":"A.","family":"Bosio","sequence":"additional","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"A fast sweep-line-based failure pattern extractor for memory diagnosis","author":"wei","year":"2016","journal-title":"21th IEEE European Test Symposium (ETS)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090808"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICSCS.2008.4746914"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2009.5410813"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2008.4695898"},{"key":"ref15","article-title":"Case Studies of Fault Isolation for the Global Failing Patterns on SRAM Bitmap caused by the Defects in Peripheral Logic Regions","author":"yin","year":"2013","journal-title":"Proc IEEE SEMI Advanced Semiconductor Manufacturing Conf"},{"key":"ref16","article-title":"An Advanced Diagnosis Flow for SRAMs","author":"ho","year":"2017","journal-title":"informal Proceedings of 43rd International Symposium for Testing and Failure Analysis"},{"year":"2016","key":"ref17","article-title":"CustomSimTM User Guide"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2005194"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510868"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2011.5898161"},{"journal-title":"Advanced test Methods for SRAMs - Effective Solutions for Dynamic fault Detection in Nanoscaled Technologies","year":"2009","author":"bosio","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.16"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2012.6212933"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1991","author":"van de goor","key":"ref2"},{"year":"0","key":"ref1","article-title":"International Roadmap for Devices and Systems"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2462820"}],"event":{"name":"2018 IEEE International Test Conference (ITC)","start":{"date-parts":[[2018,10,29]]},"location":"Phoenix, AZ, USA","end":{"date-parts":[[2018,11,1]]}},"container-title":["2018 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610502\/8624670\/08624799.pdf?arnumber=8624799","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T23:23:35Z","timestamp":1643239415000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624799\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/test.2018.8624799","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}