{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T02:48:05Z","timestamp":1725763685988},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/test.2018.8624870","type":"proceedings-article","created":{"date-parts":[[2019,1,25]],"date-time":"2019-01-25T03:09:16Z","timestamp":1548385756000},"page":"1-7","source":"Crossref","is-referenced-by-count":5,"title":["Production Tests Coverage Analysis in the Simulation Environment"],"prefix":"10.1109","author":[{"given":"Niveditha","family":"Manjunath","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dieter","family":"Haerle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephen","family":"Sabanal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Herbert","family":"Eichinger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hermann","family":"Tauber","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andreas","family":"Machne","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Manthey","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mikko","family":"Vaananen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Radu","family":"Grosu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dejan","family":"Nickovic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2360458"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2015.7177867"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2616159"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/32.988497"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.771183"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/43.285252"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2016.2590985"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818741"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2016.7519486"},{"journal-title":"Structure and signal path analysis for analog and digital circuits","year":"2013","author":"eick","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.1999.804205"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.1998.814913"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743212"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139127"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035281"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805831"},{"key":"ref2","article-title":"Systematic testing of analog-mixed signal systems","author":"heindl","year":"2017","journal-title":"Master's thesis TU Wien"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.644035"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.125"}],"event":{"name":"2018 IEEE International Test Conference (ITC)","start":{"date-parts":[[2018,10,29]]},"location":"Phoenix, AZ, USA","end":{"date-parts":[[2018,11,1]]}},"container-title":["2018 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610502\/8624670\/08624870.pdf?arnumber=8624870","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T23:01:58Z","timestamp":1643238118000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624870\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2018.8624870","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}