{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T21:44:55Z","timestamp":1743457495318,"version":"3.37.3"},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2018,4,1]],"date-time":"2018-04-01T00:00:00Z","timestamp":1522540800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Emerg. Topics Comput."],"published-print":{"date-parts":[[2018,4,1]]},"DOI":"10.1109\/tetc.2016.2624311","type":"journal-article","created":{"date-parts":[[2016,11,7]],"date-time":"2016-11-07T19:07:41Z","timestamp":1478545661000},"page":"278-287","source":"Crossref","is-referenced-by-count":7,"title":["Scan-Chain Intra-Cell Aware Testing"],"prefix":"10.1109","volume":"6","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9503-3774","authenticated-orcid":false,"given":"Aymen","family":"Touati","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6116-7339","authenticated-orcid":false,"given":"Alberto","family":"Bosio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Patrick","family":"Girard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arnaud","family":"Virazel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo","family":"Bernardi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2899-7669","authenticated-orcid":false,"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Etienne","family":"Auvray","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2015.7127349"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"1748","DOI":"10.1109\/TCAD.2005.852457","article-title":"Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs","volume":"24","author":"li","year":"2005","journal-title":"IEEE Trans Comput -Aided Des Integrated Circuits Syst"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2009.5012098"},{"journal-title":"Tessent Scan and ATPG Users Manual","year":"0","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401533"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2323216"},{"key":"ref6","doi-asserted-by":"crossref","DOI":"10.1007\/b117406","author":"bushnell","year":"2002","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2014.6868814"},{"key":"ref8","first-page":"318","article-title":"Diagnosing cell internal defects using analog simulation-based fault models","author":"huaxing","year":"0","journal-title":"Proc IEEE Asian Test Symp"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529889"},{"key":"ref2","article-title":"Towards a world without test escapes","author":"eichenberger","year":"0","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386963"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847814"}],"container-title":["IEEE Transactions on Emerging Topics in Computing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6245516\/8372818\/07737018.pdf?arnumber=7737018","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:25:55Z","timestamp":1642004755000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7737018\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4,1]]},"references-count":13,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tetc.2016.2624311","relation":{},"ISSN":["2168-6750"],"issn-type":[{"type":"electronic","value":"2168-6750"}],"subject":[],"published":{"date-parts":[[2018,4,1]]}}}