{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T08:50:26Z","timestamp":1781859026804,"version":"3.54.5"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"NSF I UCRC for Embedded Systems at SIUC","award":["NSF 1535658"],"award-info":[{"award-number":["NSF 1535658"]}]},{"name":"NSF I UCRC for Embedded Systems at SIUC","award":["NSF IIP 1361847"],"award-info":[{"award-number":["NSF IIP 1361847"]}]},{"name":"NSF I UCRC for Embedded Systems at SIUC","award":["NSF IIP 1432026"],"award-info":[{"award-number":["NSF IIP 1432026"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Emerg. Topics Comput."],"published-print":{"date-parts":[[2020,7,1]]},"DOI":"10.1109\/tetc.2017.2776285","type":"journal-article","created":{"date-parts":[[2017,11,22]],"date-time":"2017-11-22T19:23:13Z","timestamp":1511378593000},"page":"616-626","source":"Crossref","is-referenced-by-count":125,"title":["Radiation Hardened Latch Designs for Double and Triple Node Upsets"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8954-0382","authenticated-orcid":false,"given":"Adam","family":"Watkins","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Spyros","family":"Tragoudas","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2007.50"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.887832"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2016.7684062"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.72"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873683"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2015.7229830"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/el.2015.3020"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.874496"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378631"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0019"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2453795"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.24"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.15"},{"key":"ref8","first-page":"617","article-title":"Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process","author":"hazucha","year":"2003","journal-title":"Proc IEEE Custom Integr Circuits Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0099"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2254722"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2008.4695897"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126615500073"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/1229175.1229176"}],"container-title":["IEEE Transactions on Emerging Topics in Computing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6245516\/9185109\/08118119.pdf?arnumber=8118119","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T17:21:41Z","timestamp":1651080101000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8118119\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7,1]]},"references-count":20,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tetc.2017.2776285","relation":{},"ISSN":["2168-6750","2376-4562"],"issn-type":[{"value":"2168-6750","type":"electronic"},{"value":"2376-4562","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,7,1]]}}}