{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T17:20:28Z","timestamp":1783790428722,"version":"3.55.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Emerg. Topics Comput."],"published-print":{"date-parts":[[2025,4]]},"DOI":"10.1109\/tetc.2024.3403757","type":"journal-article","created":{"date-parts":[[2024,5,30]],"date-time":"2024-05-30T17:53:01Z","timestamp":1717091581000},"page":"382-394","source":"Crossref","is-referenced-by-count":7,"title":["Investigating the Resilience Source of Classification Systems for Approximate Computing Techniques"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1417-6328","authenticated-orcid":false,"given":"Mario","family":"Barbareschi","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2007-3744","authenticated-orcid":false,"given":"Salvatore","family":"Barone","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10115-021-01565-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-67308-0_5"},{"key":"ref3","first-page":"1","article-title":"ALWANN: Automatic layer-wise approximation of deep neural network accelerators without retraining","volume-title":"Proc. IEEE\/ACM Int. Conf. Comput.-Aided Des.","author":"Mrazek"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3019460"},{"key":"ref5","first-page":"1","article-title":"Analysis and characterization of inherent application resilience for approximate computing","volume-title":"Proc. 50th Annu. Des. Autom. Conf.","author":"Chippa"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-94705-7"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3087858"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-99322-5_9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2022.3186240"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3014430"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2022.3170502"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2021.3072666"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2017.2731770"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3501772"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2276759"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744904"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/fi12070113"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2940943"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2856362"},{"issue":"4148","key":"ref21","doi-asserted-by":"crossref","first-page":"688","DOI":"10.1038\/163688a0","article-title":"Measurement of diversity","volume":"163","author":"Simpson","year":"1949","journal-title":"Nature"},{"key":"ref22","volume-title":"Classification and Regression Trees","author":"Breiman","year":"1984"},{"key":"ref23","article-title":"Avila","author":"Claudio Stefano","year":"2018"},{"key":"ref24","article-title":"Dry bean dataset","year":"2020"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref26","article-title":"MNIST handwritten digit database","author":"LeCun","year":"1998"},{"key":"ref27","first-page":"770","article-title":"Deep residual learning for image recognition","volume-title":"Proc. IEEE Conf. Comput. Vis. Pattern Recognit.","author":"He"},{"key":"ref28","article-title":"CIFAR-10 (canadian institute for advanced research)","author":"Krizhevsky","year":"2010"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-21434-9_2"},{"key":"ref30","first-page":"1","article-title":"A running performance metric and termination criterion for evaluating evolutionary multi- and many-objective optimization algorithms","volume-title":"Proc. IEEE Congr. Evol. Comput.","author":"Blank"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.5555\/1953048.2078195"},{"key":"ref32","doi-asserted-by":"crossref","DOI":"10.1016\/j.compag.2020.105507","article-title":"Multiclass classification of dry beans using computer vision and machine learning techniques","volume":"174","author":"Koklu","year":"2020","journal-title":"Comput. Electron. Agriculture"},{"key":"ref33","article-title":"Spambase data set","author":"Hopkins","year":"1999"},{"key":"ref34","first-page":"265","article-title":"TensorFlow: A system for large-scale machine learning","volume-title":"Proc. 12th USENIX Conf. Operat. Syst. Des. Implementation","author":"Abadi","year":"2016"},{"key":"ref35","article-title":"PyTorch: An imperative style, high-performance deep learning library","author":"Paszke","year":"2019"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/4235.797969"}],"container-title":["IEEE Transactions on Emerging Topics in Computing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6245516\/11045241\/10542568.pdf?arnumber=10542568","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T06:44:18Z","timestamp":1750747458000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10542568\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4]]},"references-count":36,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tetc.2024.3403757","relation":{},"ISSN":["2168-6750","2376-4562"],"issn-type":[{"value":"2168-6750","type":"electronic"},{"value":"2376-4562","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4]]}}}