{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,15]],"date-time":"2025-06-15T12:10:09Z","timestamp":1749989409544,"version":"3.41.0"},"reference-count":77,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2017,4,1]],"date-time":"2017-04-01T00:00:00Z","timestamp":1491004800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Economic Development Board Industrial Postgraduate Fund","award":["R-263-000-A70-592"],"award-info":[{"award-number":["R-263-000-A70-592"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Emerg. Top. Comput. Intell."],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/tetci.2017.2669523","type":"journal-article","created":{"date-parts":[[2017,2,15]],"date-time":"2017-02-15T19:15:23Z","timestamp":1487186123000},"page":"87-96","source":"Crossref","is-referenced-by-count":7,"title":["Automatic Microstructure Defect Detection of Ti-6Al-4V Titanium Alloy by Regions-Based Graph"],"prefix":"10.1109","volume":"1","author":[{"given":"Ruoxu","family":"Ren","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Terence","family":"Hung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kay Chen","family":"Tan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref73","DOI":"10.1109\/CVPR.2015.7299031"},{"doi-asserted-by":"publisher","key":"ref72","DOI":"10.1109\/CVPR.2014.461"},{"doi-asserted-by":"publisher","key":"ref71","DOI":"10.1109\/CVPR.2014.222"},{"year":"1993","author":"nadler","journal-title":"Pattern Recognition Engineering","key":"ref70"},{"doi-asserted-by":"publisher","key":"ref76","DOI":"10.1016\/j.jmst.2016.03.010"},{"doi-asserted-by":"publisher","key":"ref77","DOI":"10.1016\/j.jallcom.2016.11.303"},{"key":"ref74","article-title":"Return of the devil in the details: Delving deep into convolutional nets","author":"chatfield","year":"2014","journal-title":"Proc British Mach Vis Conf"},{"doi-asserted-by":"publisher","key":"ref39","DOI":"10.1109\/TEVC.2013.2255611"},{"doi-asserted-by":"publisher","key":"ref75","DOI":"10.1007\/s00138-002-0084-z"},{"doi-asserted-by":"publisher","key":"ref38","DOI":"10.1109\/TCYB.2014.2346793"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/TSMCB.2011.2162400"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1109\/34.85670"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/TCYB.2014.2326059"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/TCYB.2014.2326596"},{"doi-asserted-by":"publisher","key":"ref37","DOI":"10.1109\/TCYB.2015.2403356"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/TCYB.2014.2307862"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/MCI.2016.2532268"},{"key":"ref34","doi-asserted-by":"crossref","first-page":"1454","DOI":"10.1109\/TPAMI.2007.1038","article-title":"Texems: Texture exemplars for defect detection on random textured surfaces","volume":"29","author":"xianghua","year":"2007","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"ref60","doi-asserted-by":"crossref","first-page":"899","DOI":"10.31399\/asm.hb.v09.a0003779","author":"gammon","year":"2004","journal-title":"Metallography and Microstructures of Titanium and its Alloys"},{"doi-asserted-by":"publisher","key":"ref62","DOI":"10.1007\/978-1-4684-3893-2_2"},{"key":"ref61","volume":"2","author":"west","year":"2001","journal-title":"Introduction to Graph Theory"},{"year":"2008","author":"nixon","journal-title":"Feature Extraction & Image Processing","key":"ref63"},{"key":"ref28","first-page":"428","article-title":"Comparison of various filter sets for defect detection in textiles","author":"ade","year":"1984","journal-title":"Proc Int Conf Pattern Recognit"},{"doi-asserted-by":"publisher","key":"ref64","DOI":"10.1002\/0471745790"},{"key":"ref27","first-page":"123","article-title":"Real-time aspects of SOM-based visual surface inspection","author":"niskanen","year":"2002","journal-title":"Proc Electron Imag"},{"key":"ref65","first-page":"285","article-title":"A threshold selection method from gray-level histograms","volume":"11","author":"otsu","year":"1975","journal-title":"Automatica"},{"doi-asserted-by":"publisher","key":"ref66","DOI":"10.1117\/3.501104"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1117\/1.601692"},{"key":"ref67","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-84800-191-6","author":"burger","year":"2009","journal-title":"Principles of Digital Image Processing"},{"doi-asserted-by":"publisher","key":"ref68","DOI":"10.1016\/0031-3203(91)90052-7"},{"doi-asserted-by":"publisher","key":"ref69","DOI":"10.1109\/TSMC.1973.4309314"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/4235.752917"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1533\/9781845695866"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"1","DOI":"10.5565\/rev\/elcvia.268","article-title":"A review of recent advances in surface defect detection using texture analysis techniques","volume":"7","author":"xie","year":"2008","journal-title":"Electron Lett Comput Vis Image Anal"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TPAMI.2002.1017623"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/S0031-3203(03)00005-0"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/TIP.2014.2325777"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TIP.2015.2476955"},{"key":"ref26","first-page":"336","article-title":"Color and texture based wood inspection with non-supervised clustering","author":"niskanen","year":"2001","journal-title":"Proc Scand Conf Image Anal"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/TIP.2012.2204271"},{"year":"2010","journal-title":"Standard Test Methods for Determining Average Grain Size","key":"ref50"},{"doi-asserted-by":"publisher","key":"ref51","DOI":"10.1016\/j.msea.2003.12.008"},{"doi-asserted-by":"publisher","key":"ref59","DOI":"10.1016\/j.knosys.2016.02.012"},{"doi-asserted-by":"publisher","key":"ref58","DOI":"10.1002\/piq.21223"},{"doi-asserted-by":"publisher","key":"ref57","DOI":"10.1007\/978-3-642-40246-3_45"},{"doi-asserted-by":"publisher","key":"ref56","DOI":"10.1016\/S1044-5803(01)00117-6"},{"key":"ref55","first-page":"25","article-title":"Segment the metallograph images using Gabor filter","author":"wen","year":"1994","journal-title":"Proc Int Symp Speech Image Process Neural Netw"},{"doi-asserted-by":"publisher","key":"ref54","DOI":"10.1109\/INDCON.2010.5712693"},{"doi-asserted-by":"publisher","key":"ref53","DOI":"10.1109\/EEEI.2008.4736565"},{"doi-asserted-by":"publisher","key":"ref52","DOI":"10.1016\/S1044-5803(01)00106-1"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"2099","DOI":"10.1109\/TCYB.2014.2301193","article-title":"Human body segmentation via data-driven graph cut","volume":"44","author":"li","year":"2014","journal-title":"IEEE Trans Cybern"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TCYB.2014.2324815"},{"doi-asserted-by":"publisher","key":"ref40","DOI":"10.1109\/4235.687881"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TSMC.2013.2297398"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TCYB.2014.2340032"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1007\/s00138-005-0009-8"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/ICPR.2004.1333765"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1007\/s10044-004-0232-3"},{"key":"ref17","first-page":"29","article-title":"A structural approach to identify defects in textured images","author":"chen","year":"1988","journal-title":"Proc IEEE Int Conf Syst Man Cybern"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1177\/004051750007000902"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/S0167-8655(98)00150-0"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TEVC.2015.2476359"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TEVC.2016.2515660"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TCYB.2014.2352343"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1023\/B:VISI.0000022288.19776.77"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TCYB.2013.2256891"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TCYB.2015.2409119"},{"doi-asserted-by":"publisher","key":"ref49","DOI":"10.1016\/j.ijfatigue.2012.01.006"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TSMCB.2012.2218233"},{"year":"2001","author":"ellingson","article-title":"Optical method and apparatus for detection of defects and microstructural changes in ceramics and ceramic coatings","key":"ref46"},{"year":"1989","author":"bin-ming","article-title":"Method and apparatus for detecting defects in repeated microminiature patterns","key":"ref45"},{"doi-asserted-by":"publisher","key":"ref48","DOI":"10.1109\/TEVC.2014.2367111"},{"year":"2006","author":"sun","article-title":"Device and nondestructive method to determine subsurface micro-structure in dense materials","key":"ref47"},{"doi-asserted-by":"publisher","key":"ref42","DOI":"10.1109\/TEVC.2016.2577548"},{"doi-asserted-by":"publisher","key":"ref41","DOI":"10.1109\/TEVC.2002.806167"},{"year":"2006","author":"maayah","article-title":"Automated repetitive array microstructure defect inspection","key":"ref44"},{"year":"2001","author":"lo","article-title":"Microstructure defect detection","key":"ref43"}],"container-title":["IEEE Transactions on Emerging Topics in Computational Intelligence"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7433297\/7886425\/07857097.pdf?arnumber=7857097","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,15]],"date-time":"2025-06-15T11:36:33Z","timestamp":1749987393000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7857097\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":77,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tetci.2017.2669523","relation":{},"ISSN":["2471-285X"],"issn-type":[{"type":"electronic","value":"2471-285X"}],"subject":[],"published":{"date-parts":[[2017,4]]}}}