{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T12:07:44Z","timestamp":1762430864212},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2014,2,1]],"date-time":"2014-02-01T00:00:00Z","timestamp":1391212800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Fuzzy Syst."],"published-print":{"date-parts":[[2014,2]]},"DOI":"10.1109\/tfuzz.2013.2250290","type":"journal-article","created":{"date-parts":[[2014,1,30]],"date-time":"2014-01-30T20:34:39Z","timestamp":1391114079000},"page":"201-211","source":"Crossref","is-referenced-by-count":41,"title":["An Agent-Based Fuzzy Collaborative Intelligence Approach for Precise and Accurate Semiconductor Yield Forecasting"],"prefix":"10.1109","volume":"22","author":[{"family":"Toly Chen","sequence":"first","affiliation":[]},{"family":"Yi-Chi Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.na.2011.02.050"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/0165-0114(88)90054-1"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/0165-0114(94)90144-9"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-68860-0_6"},{"key":"ref31","author":"nocedal","year":"2006","journal-title":"Numerical Optimization"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2174061"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.2307\/3003508"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/IEMT.1996.559753"},{"key":"ref35","year":"0"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2162416"},{"key":"ref10","author":"gruber","year":"1994","journal-title":"Learning and Strategic Product Innovation Theory and Evidence for the Semiconductor Industry"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2143418"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2161612"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2164256"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2012.2201485"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2007.896353"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2170175"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2179303"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2158218"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2158219"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2150756"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1287\/opre.45.3.440"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/66.762883"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1142\/S0218488508005030"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2158651"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"763","DOI":"10.3233\/IDA-2011-0494","article-title":"A fuzzy-neural approach for global CO<formula formulatype=\"inline\"><tex Notation=\"TeX\">$_{2}$<\/tex><\/formula> concentration forecasting","volume":"15","author":"chen","year":"2011","journal-title":"Intell Data Anal"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2174366"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0165-0114(97)00265-0"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2175400"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.2011.5872229"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2152815"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2012.2187062"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISDA.2008.71"},{"key":"ref20","first-page":"5","article-title":"Yield learning model for integrated circuit manufacturing","volume":"18","author":"latourette","year":"1994","journal-title":"Semicond Int"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.4018\/ijfsa.2011040103"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.4018\/ijfsa.2011070101"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2182354"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2173693"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2181179"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-444-42723-6.50018-0"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijar.2003.07.004"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2012.2187453"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2012.2189405"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2172948"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2179659"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2002.1001627"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.2307\/2555574"}],"container-title":["IEEE Transactions on Fuzzy Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/91\/6729075\/06472058.pdf?arnumber=6472058","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:31:50Z","timestamp":1642005110000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6472058\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,2]]},"references-count":47,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tfuzz.2013.2250290","relation":{},"ISSN":["1063-6706","1941-0034"],"issn-type":[{"value":"1063-6706","type":"print"},{"value":"1941-0034","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,2]]}}}