{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,13]],"date-time":"2025-09-13T16:35:06Z","timestamp":1757781306226,"version":"3.44.0"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Innovation Project of Equipment Development Department, Information Perception Technology","award":["E01Z040601"],"award-info":[{"award-number":["E01Z040601"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Geosci. Remote Sensing"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tgrs.2023.3290074","type":"journal-article","created":{"date-parts":[[2023,6,27]],"date-time":"2023-06-27T13:35:23Z","timestamp":1687872923000},"page":"1-17","source":"Crossref","is-referenced-by-count":3,"title":["Efficient Feature Relation Learning Network for Cross-Spectral Image Patch Matching"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2604-4282","authenticated-orcid":false,"given":"Chuang","family":"Yu","sequence":"first","affiliation":[{"name":"Key Laboratory of Opto-Electronic Information Processing, Shenyang Institute of Automation, and the Institute for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-4700-7183","authenticated-orcid":false,"given":"Jinmiao","family":"Zhao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Opto-Electronic Information Processing, Shenyang Institute of Automation, and the Institute for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7758-6308","authenticated-orcid":false,"given":"Yunpeng","family":"Liu","sequence":"additional","affiliation":[{"name":"Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuhang","family":"Wu","sequence":"additional","affiliation":[{"name":"Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7803-8282","authenticated-orcid":false,"given":"Chenxi","family":"Li","sequence":"additional","affiliation":[{"name":"Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1023\/B:VISI.0000029664.99615.94"},{"key":"ref35","article-title":"Working hard to know your neighbor’s margins: Local descriptor learning loss","author":"mishchuk","year":"2017","journal-title":"arXiv 1705 10872"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.1995.466930"},{"key":"ref34","article-title":"PN-Net: Conjoined triple deep network for learning local image descriptors","author":"balntas","year":"2016","journal-title":"arXiv 1601 05030"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2005.177"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7299064"},{"key":"ref14","first-page":"1","article-title":"PCA-SIFT: A more distinctive representation for local image descriptors","author":"ke","year":"2004","journal-title":"Proc IEEE Comput Soc Conf Comput Vis Pattern Recognit"},{"key":"ref36","first-page":"3279","article-title":"MatchNet: Unifying feature and metric learning for patch-based matching","author":"han","year":"2015","journal-title":"Proc IEEE Conf Comput Vis Pattern Recognit (CVPR)"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00292"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.649"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1977.1674847"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00491"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1972.5008923"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00306"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2022.3173476"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2626373"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2011.6126544"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2016.40"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"346","DOI":"10.1016\/j.cviu.2007.09.014","article-title":"Speeded-up robust features (SURF)","volume":"110","author":"bay","year":"2008","journal-title":"Comput Vis Image Understand"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2021.3101414"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2011.6115818"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33783-3_16"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2015.7350783"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2020.3026162"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2014.2354731"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01155"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2022.3178984"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2913372"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2020.3001401"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2011.5995637"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.5244\/C.26.103"},{"key":"ref42","first-page":"115","article-title":"Cross-spectral image patch matching by learning features of the spatially connected patches in a shared space","author":"quan","year":"2018","journal-title":"Proc Asian Conf Comput Vis (ACCV)"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2018.8451804"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2007.383003"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2022.3176358"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/s120912661"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00311"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.2984244"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2022.3181355"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.22"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2020.2999180"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2018.2861991"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3052756"},{"key":"ref4","first-page":"2825","article-title":"H-patches: A benchmark and evaluation of handcrafted and learned local descriptors","volume":"42","author":"balntas","year":"2020","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2018.2816743"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2017.2765761"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2237921"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/s17040873"}],"container-title":["IEEE Transactions on Geoscience and Remote Sensing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/36\/10006360\/10164118.pdf?arnumber=10164118","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,5]],"date-time":"2025-09-05T18:21:19Z","timestamp":1757096479000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10164118\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":48,"URL":"https:\/\/doi.org\/10.1109\/tgrs.2023.3290074","relation":{},"ISSN":["0196-2892","1558-0644"],"issn-type":[{"type":"print","value":"0196-2892"},{"type":"electronic","value":"1558-0644"}],"subject":[],"published":{"date-parts":[[2023]]}}}