{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T09:57:12Z","timestamp":1740131832686,"version":"3.37.3"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["41774079","41850410490"],"award-info":[{"award-number":["41774079","41850410490"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Geosci. Remote Sensing"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tgrs.2024.3452702","type":"journal-article","created":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:55:20Z","timestamp":1725472520000},"page":"1-16","source":"Crossref","is-referenced-by-count":0,"title":["Data-Driven Confidence Intervals for Parametric Magnetotelluric Impedance Tensor Estimates"],"prefix":"10.1109","volume":"62","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4994-0357","authenticated-orcid":false,"given":"Xinyi","family":"Xu","sequence":"first","affiliation":[{"name":"School of Engineering, Westlake University, Hangzhou, Zhejiang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6790-9882","authenticated-orcid":false,"given":"Bo","family":"Yang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Geoscience Big Data and Deep Resource of Zhejiang Province, School of Earth Sciences, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7992-3750","authenticated-orcid":false,"given":"Mark D.","family":"Butala","sequence":"additional","affiliation":[{"name":"James Watt School of Engineering, University of Glasgow, Glasgow, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1190\/1.1437915"},{"key":"ref2","first-page":"271","article-title":"Changes in earth current and their relation to the electrical state of the Earths crust","volume":"29","author":"Rikitake","year":"1951","journal-title":"Bull. Earthq. Res. Inst., Univ. Tokyo"},{"issue":"2","key":"ref3","first-page":"295","article-title":"On determining electrical characteristics of the deep layers of the earths crust","volume":"73","author":"Tikhonov","year":"1950","journal-title":"Doklady"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781139020138"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1190\/1.1440225"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/SERIES1345"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-246X.1986.tb04552.x"},{"issue":"1","key":"ref8","first-page":"87","article-title":"Magnetotellurics with a remote reference","volume":"81","author":"Gamble","year":"1978","journal-title":"Geophysics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1046\/j.1365-246X.1998.00440.x"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1190\/1.1894081"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-246X.1988.tb02009.x"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1190\/1.1444742"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1186\/s40623-016-0446-9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00024-012-0620-3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/047134608X.W1046"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tac.1983.1103156"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1046\/j.1365-246x.2001.00292.x"},{"volume-title":"Asymptotic Methods in Analysis","year":"2010","author":"de Bruijn","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.2307\/2344939"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1029\/JB094iB10p14215"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176345462"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2478.2012.01094.x"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tgrs.2022.3140460"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511618888.009"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(80)90078-3"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-246X.1986.tb04552.x"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.8075977"},{"volume-title":"System Identification","year":"5555","author":"S\u00f6derstr\u00f6m","key":"ref28"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2004.03.005"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2005.10.003"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176325770"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1142\/9781860948886_0011"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/79.647043"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/9.983387"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.1999.831283"},{"volume-title":"Understanding Digital Signal Processing","year":"2010","author":"Lyons","key":"ref36"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2010.02.015"}],"container-title":["IEEE Transactions on Geoscience and Remote Sensing"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/36\/10354519\/10664610-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/36\/10354519\/10664610.pdf?arnumber=10664610","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,25]],"date-time":"2024-09-25T05:43:01Z","timestamp":1727242981000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10664610\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/tgrs.2024.3452702","relation":{},"ISSN":["0196-2892","1558-0644"],"issn-type":[{"type":"print","value":"0196-2892"},{"type":"electronic","value":"1558-0644"}],"subject":[],"published":{"date-parts":[[2024]]}}}