{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T19:10:20Z","timestamp":1756321820465,"version":"3.44.0"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"Zhejiang Provincial Natural Science Foundation of China","doi-asserted-by":"publisher","award":["LZ23F020007","LDT23F02025F02"],"award-info":[{"award-number":["LZ23F020007","LDT23F02025F02"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62472133","61972119","62422204"],"award-info":[{"award-number":["62472133","61972119","62422204"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100022963","name":"Key Research and Development Program of Zhejiang Province","doi-asserted-by":"publisher","award":["2025C01026"],"award-info":[{"award-number":["2025C01026"]}],"id":[{"id":"10.13039\/100022963","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Geosci. Remote Sensing"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tgrs.2025.3599591","type":"journal-article","created":{"date-parts":[[2025,8,19]],"date-time":"2025-08-19T18:16:06Z","timestamp":1755627366000},"page":"1-11","source":"Crossref","is-referenced-by-count":0,"title":["ScatDiff: Physical Diffusion Model for Electromagnetic Computational Imaging"],"prefix":"10.1109","volume":"63","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1842-4050","authenticated-orcid":false,"given":"Min","family":"Tan","sequence":"first","affiliation":[{"name":"Key Laboratory of Zhejiang Key Laboratory of Space Information Sensing and Transmission, Hangzhou Dianzi University, Hangzhou, China"}]},{"given":"Hang","family":"Zhou","sequence":"additional","affiliation":[{"name":"Key Laboratory of Complex Systems Modeling and Simulation, School of Computer Science and Technology, Hangzhou Dianzi University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4943-5668","authenticated-orcid":false,"given":"Kuiwen","family":"Xu","sequence":"additional","affiliation":[{"name":"Innovation Center for Electronic Design Automation Technology, and Shaoxing Integrated Circuit Institute, Hangzhou Dianzi University, Hangzhou, China"}]},{"given":"Shuqing","family":"Li","sequence":"additional","affiliation":[{"name":"Key Laboratory of Complex Systems Modeling and Simulation, School of Computer Science and Technology, Hangzhou Dianzi University, Hangzhou, China"}]},{"given":"Yuxin","family":"Zhang","sequence":"additional","affiliation":[{"name":"Innovation Center for Electronic Design Automation Technology, and Shaoxing Integrated Circuit Institute, Hangzhou Dianzi University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8407-1137","authenticated-orcid":false,"given":"Zhou","family":"Yu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Complex Systems Modeling and Simulation, School of Computer Science and Technology, Hangzhou Dianzi University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1922-7283","authenticated-orcid":false,"given":"Jun","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Intelligence Science and Engineering, Harbin Institute of Technology, Shenzhen, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.00921"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3510797"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3520560"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2015.2506182"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2019.2916369"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2021.3093793"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.3015495"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2019.2902667"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2019.2915580"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2025.3532363"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3012177"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2023.3278349"},{"key":"ref13","first-page":"6840","article-title":"Denoising diffusion probabilistic models","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Ho"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3349681"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01042"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1984.1132783"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2008.2006360"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2009.2025122"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2018.2885437"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2018.2869221"},{"key":"ref21","article-title":"Denoising diffusion implicit models","author":"Song","year":"2020","journal-title":"arXiv:2010.02502"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2019.2921861"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2932058"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3520231"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2025.3547153"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2025.3530429"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2025.3542019"},{"key":"ref28","first-page":"5998","article-title":"Attention is all you need","volume-title":"Proc. Neural Inf. Process. Syst.","volume":"30","author":"Vaswani"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2023.3340109"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1002\/9781119311997"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.00684"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ANTEM.2005.7852080"},{"article-title":"Deep learning for classical Japanese literature","volume-title":"arXiv:1812.01718","author":"Clanuwat","key":"ref33"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2020.2977995"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2020.3026447"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.23919\/URSIAP-RASC.2019.8738745"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2022.3228945"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2025.3539938"}],"container-title":["IEEE Transactions on Geoscience and Remote Sensing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/36\/10807682\/11127044.pdf?arnumber=11127044","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T18:30:45Z","timestamp":1756319445000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11127044\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/tgrs.2025.3599591","relation":{},"ISSN":["0196-2892","1558-0644"],"issn-type":[{"type":"print","value":"0196-2892"},{"type":"electronic","value":"1558-0644"}],"subject":[],"published":{"date-parts":[[2025]]}}}