{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,23]],"date-time":"2026-02-23T21:38:56Z","timestamp":1771882736060,"version":"3.50.1"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2009,12,1]],"date-time":"2009-12-01T00:00:00Z","timestamp":1259625600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2009,12]]},"DOI":"10.1109\/tie.2008.2011479","type":"journal-article","created":{"date-parts":[[2009,1,16]],"date-time":"2009-01-16T16:16:24Z","timestamp":1232122584000},"page":"4836-4843","source":"Crossref","is-referenced-by-count":122,"title":["A Remote Laboratory in Engineering Measurement"],"prefix":"10.1109","volume":"56","author":[{"given":"M.T.","family":"Restivo","sequence":"first","affiliation":[]},{"given":"J.","family":"Mendes","sequence":"additional","affiliation":[]},{"given":"A.M.","family":"Lopes","sequence":"additional","affiliation":[]},{"given":"C.M.","family":"Silva","sequence":"additional","affiliation":[]},{"given":"F.","family":"Chouzal","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.compedu.2005.11.019"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.920650"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TE.2006.873982"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2005.864143"},{"key":"ref34","first-page":"870","article-title":"a remote access haptic experiment for mechanical material characterization","author":"machado","year":"2008","journal-title":"Proc 7th CONTROLO"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2006.347963"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2006.347924"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2005.1529185"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.907021"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.907025"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.907024"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.907013"},{"key":"ref17","first-page":"63","author":"samoila","year":"2007","journal-title":"Advances on Remote Laboratories and E-Learning Experiences"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TE.2005.853074"},{"key":"ref19","article-title":"e-learning, from methodology at new mentality","author":"samoila","year":"2006","journal-title":"Proc IMC"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2006.347780"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.922590"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2005.1529187"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2005.1529184"},{"key":"ref6","year":"2007","journal-title":"Length and Related Quantities Capabilities"},{"key":"ref29","article-title":"a moodle extension to book online labs","author":"ferreira","year":"2005","journal-title":"Proc RE"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.922400"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/FIE.2004.1408586"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1132960.1132961"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TE.2006.873975"},{"key":"ref9","author":"restivo","year":"2003","journal-title":"Medio de Deformao"},{"key":"ref1","first-page":"92","article-title":"on the way for a better methodology in teaching\/learning instrumentation for measurements at mechanical engineering compulsory syllabus","author":"restivo","year":"2004","journal-title":"Proc WCET"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2004.1299531"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICELIE.2006.347182"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847205"},{"key":"ref24","article-title":"measurement uncertainty. determination of the young's modulus of an aluminium specimen (tensile test machine; bending test)","author":"restivo","year":"2004","journal-title":"The European Federation of National Associations of Measurement Testing and Analytical Laboratories (EuroLab)"},{"key":"ref23","author":"restivo","year":"2008","journal-title":"Laboratories of Instrumentation for Measurement"},{"key":"ref26","first-page":"798","article-title":"easy java simulations: an open-source tool to develop interactive virtual laboratories using matlab\/simulink","volume":"21","author":"sanchez","year":"2005","journal-title":"Int J Eng Educ"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2005.1388798"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/41\/5291658\/04745803.pdf?arnumber=4745803","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:59:36Z","timestamp":1633910376000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4745803\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,12]]},"references-count":34,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2008.2011479","relation":{},"ISSN":["0278-0046"],"issn-type":[{"value":"0278-0046","type":"print"}],"subject":[],"published":{"date-parts":[[2009,12]]}}}