{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T18:04:51Z","timestamp":1775325891447,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2011,5,1]],"date-time":"2011-05-01T00:00:00Z","timestamp":1304208000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/tie.2010.2072895","type":"journal-article","created":{"date-parts":[[2010,9,7]],"date-time":"2010-09-07T20:20:00Z","timestamp":1283890800000},"page":"1586-1593","source":"Crossref","is-referenced-by-count":75,"title":["Simple Fault Diagnosis Based on Operating Characteristic of Brushless Direct-Current Motor Drives"],"prefix":"10.1109","volume":"58","author":[{"given":"Byoung-Gun","family":"Park","sequence":"first","affiliation":[]},{"given":"Kui-Jun","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Rae-Young","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Tae-Sung","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Ji-Su","family":"Ryu","sequence":"additional","affiliation":[]},{"given":"Dong-Seok","family":"Hyun","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2002.807125"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.894699"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2006.886620"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2029577"},{"key":"ref13","first-page":"1015","article-title":"Fault tolerant and minimum loss control of double-star synchronous machines under open phase conditions","volume":"55","author":"nejad","year":"2008","journal-title":"IEEE Trans Ind Electron"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.911951"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2005244"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2004.1354769"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.847961"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2023640"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2003.809351"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/41.873216"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/41.873223"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2009.0183"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2004.825284"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2007527"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2007.900494"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2036026"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2003365"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2004665"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa:20070203"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"1770","DOI":"10.1109\/TIA.2009.2027535","article-title":"A literature review of IGBT fault diagnostic and protection methods for power inverters","volume":"45","author":"lu","year":"2009","journal-title":"IEEE Trans Ind Appl"},{"key":"ref1","author":"isermann","year":"2005","journal-title":"Fault-Diagnosis Systems An Introduction from Fault Detection to Fault Tolerance"},{"key":"ref20","first-page":"2654","article-title":"A novel fault detection scheme for voltage fed PWM inverter","author":"yu","year":"2006","journal-title":"Proc IEEE Ind Electron Conf"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2004.841502"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2008.0362"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.906994"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2006.295798"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2017562"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-009-2003-1"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/41\/5747179\/05560811.pdf?arnumber=5560811","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:46:04Z","timestamp":1633913164000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5560811\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":30,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2010.2072895","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,5]]}}}