{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,19]],"date-time":"2026-08-19T19:52:26Z","timestamp":1787169146703,"version":"3.56.0"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2011,7,1]],"date-time":"2011-07-01T00:00:00Z","timestamp":1309478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2011,7]]},"DOI":"10.1109\/tie.2010.2080252","type":"journal-article","created":{"date-parts":[[2010,9,29]],"date-time":"2010-09-29T15:22:47Z","timestamp":1285773767000},"page":"2582-2590","source":"Crossref","is-referenced-by-count":102,"title":["SiC Schottky Diodes for Harsh Environment Space Applications"],"prefix":"10.1109","volume":"58","author":[{"given":"Philippe","family":"Godignon","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xavier","family":"Jorda","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Miquel","family":"Vellvehi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xavier","family":"Perpina","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Viorel","family":"Banu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Demetrio","family":"Lopez","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Juan","family":"Barbero","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pierre","family":"Brosselard","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Silvia","family":"Massetti","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.diamond.2004.11.015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2009.2029090"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2007.4342356"},{"key":"ref13","author":"mcdonald","year":"1966","journal-title":"High Temperature Thermal Conductivity of Beryllium Oxide"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2027324"},{"key":"ref15","year":"2006","journal-title":"Test Method Standard Test Methods for Semiconductor Devices Rev E"},{"key":"ref16","article-title":"No. 2265000—Evaluation Test Program for Discrete Non Microwave","year":"2002","journal-title":"Semiconductors"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.1928328"},{"key":"ref18","author":"nicollian","year":"1982","journal-title":"MOS Physics and Technology"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2004.05.005"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2048292"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2005.843964"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2006.1666123"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/41.915409"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2006.870882"},{"key":"ref7","author":"ward","year":"2008","journal-title":"SiC Power Diode Reliability"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2007.07.031"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2005.10.049"},{"key":"ref9","year":"0","journal-title":"ESA Science & Technology BepiColombo"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/41\/5873561\/05585749.pdf?arnumber=5585749","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T20:46:00Z","timestamp":1633898760000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5585749\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7]]},"references-count":19,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2010.2080252","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,7]]}}}