{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,4]],"date-time":"2026-02-04T14:52:42Z","timestamp":1770216762799,"version":"3.49.0"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2012,1,1]],"date-time":"2012-01-01T00:00:00Z","timestamp":1325376000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2012,1]]},"DOI":"10.1109\/tie.2011.2151818","type":"journal-article","created":{"date-parts":[[2011,5,25]],"date-time":"2011-05-25T15:58:27Z","timestamp":1306339107000},"page":"244-256","source":"Crossref","is-referenced-by-count":55,"title":["Improvement of Matrix Converter Drive Reliability by Online Fault Detection and a Fault-Tolerant Switching Strategy"],"prefix":"10.1109","volume":"59","author":[{"given":"Khiem","family":"Nguyen-Duy","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tian-Hua","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Der-Fa","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John Y.","family":"Hung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098356"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2009.5316153"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2009.5075200"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2008.4758145"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/41.993264"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/28.821808"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2044736"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/41.605620"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/28.753644"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2007.4342127"},{"key":"ref14","first-page":"1478","article-title":"IGBT fault protection based on <ref_formula><tex Notation=\"TeX\">$di\/dt$<\/tex><\/ref_formula> feedback control","author":"huang","year":"2007","journal-title":"Proc IEEE Power Electron Spec Conf"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.1999.769220"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/28.739017"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2003.809351"},{"key":"ref18","first-page":"2654","article-title":"A novel fault detection scheme for voltage fed PWM inverter","author":"yu","year":"2006","journal-title":"Proc 32nd IEEE IECON"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2004.825284"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.872957"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/41.993268"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/28.475693"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/41.993274"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2003.813766"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/41.993270"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2006241"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/7.953242"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2003.1188906"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/41.753769"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2038940"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/63.21879"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/28.793377"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/28.245714"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/41.873223"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.830074"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/28.370271"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2040001"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2006.888018"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/41\/6032192\/05772928.pdf?arnumber=5772928","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:53:39Z","timestamp":1642006419000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5772928\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,1]]},"references-count":35,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2011.2151818","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,1]]}}}