{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T05:08:28Z","timestamp":1780463308346,"version":"3.54.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2014,9,1]],"date-time":"2014-09-01T00:00:00Z","timestamp":1409529600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/tie.2013.2290761","type":"journal-article","created":{"date-parts":[[2013,11,19]],"date-time":"2013-11-19T18:53:11Z","timestamp":1384887191000},"page":"4519-4530","source":"Crossref","is-referenced-by-count":53,"title":["Online Estimation of Double-Star IPM Machine Parameters Using RLS Algorithm"],"prefix":"10.1109","volume":"61","author":[{"given":"Samuli","family":"Kallio","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jussi","family":"Karttunen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pasi","family":"Peltoniemi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pertti","family":"Silventoinen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Olli","family":"Pyrhonen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2162214"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2010.0256"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2101994"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2206355"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2221113"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2054055"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2141136"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2198208"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.890021"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.2009614"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/63.712323"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2220967"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/63.774205"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918488"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2248338"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2219862"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2003.811720"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.811790"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2043507"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2009.5075360"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2155010"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2168792"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2168225"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2006.870875"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.880840"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2010.0262"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/28.464525"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2216241"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/6777358\/06663600.pdf?arnumber=6663600","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:31:04Z","timestamp":1642005064000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6663600\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":28,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2013.2290761","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,9]]}}}