{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,21]],"date-time":"2026-03-21T09:14:04Z","timestamp":1774084444749,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51175095"],"award-info":[{"award-number":["51175095"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Natural Science Foundation of Guangdong Province, China","award":["10251009001000001"],"award-info":[{"award-number":["10251009001000001"]}]},{"name":"Guangdong Provincial Project of Science and Technology Innovation of Discipline Construction, China","award":["2013KJCX0063"],"award-info":[{"award-number":["2013KJCX0063"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2015,1]]},"DOI":"10.1109\/tie.2014.2319216","type":"journal-article","created":{"date-parts":[[2014,4,22]],"date-time":"2014-04-22T18:03:29Z","timestamp":1398189809000},"page":"628-636","source":"Crossref","is-referenced-by-count":247,"title":["WPD-PCA-Based Laser Welding Process Monitoring and Defects Diagnosis by Using FNN and SVM"],"prefix":"10.1109","volume":"62","author":[{"given":"Deyong","family":"You","sequence":"first","affiliation":[]},{"given":"Xiangdong","family":"Gao","sequence":"additional","affiliation":[]},{"given":"Seiji","family":"Katayama","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechatronics.2011.09.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2012.03.003"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2012.02.025"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2013.07.005"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1179\/136217110X12785889549949"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2273477"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechatronics.2013.11.009"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2263777"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2261033"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2206336"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2012.6271618"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2266084"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2011.2178412"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2114311"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2206339"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2010.2045766"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2013.09.010"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2193854"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2012.2199768"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1179\/1362171813Y.0000000180"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2011.2109739"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2266085"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2230598"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2274415"},{"key":"ref24","year":"1997"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2255061"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2266086"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2262764"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/6994311\/06803929.pdf?arnumber=6803929","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:59:30Z","timestamp":1642003170000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6803929"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,1]]},"references-count":29,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2014.2319216","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,1]]}}}