{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T11:17:07Z","timestamp":1780053427082,"version":"3.54.0"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["50907070"],"award-info":[{"award-number":["50907070"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National High-Tech R&D Program of China (863 Program)","award":["2013AA050803"],"award-info":[{"award-number":["2013AA050803"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2015,1]]},"DOI":"10.1109\/tie.2014.2326997","type":"journal-article","created":{"date-parts":[[2014,9,13]],"date-time":"2014-09-13T01:18:07Z","timestamp":1410571087000},"page":"332-342","source":"Crossref","is-referenced-by-count":93,"title":["LVRT Capability Enhancement of DFIG With Switch-Type Fault Current Limiter"],"prefix":"10.1109","volume":"62","author":[{"given":"Wenyong","family":"Guo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liye","family":"Xiao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shaotao","family":"Dai","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuanhe","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xi","family":"Xu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weiwei","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luo","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2222886"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2010.2055869"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2037970"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2087037"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098630"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2205354"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2226417"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2011.0348"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2208437"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2011.2174387"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2007.914317"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2006.878241"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2273227"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2190955"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2007.895768"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2261301"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2243372"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2187654"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2008.0070"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2228141"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2253439"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2013.2240707"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2174804"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2012.0130"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2263773"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2196899"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/6994311\/06822562.pdf?arnumber=6822562","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:59:29Z","timestamp":1642003169000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6822562\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,1]]},"references-count":26,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2014.2326997","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,1]]}}}