{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T02:09:22Z","timestamp":1776132562994,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2015,4,1]],"date-time":"2015-04-01T00:00:00Z","timestamp":1427846400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/tie.2014.2351785","type":"journal-article","created":{"date-parts":[[2014,10,1]],"date-time":"2014-10-01T20:09:29Z","timestamp":1412194169000},"page":"2287-2296","source":"Crossref","is-referenced-by-count":109,"title":["Steady-State and Transient Performance of Axial-Field Eddy-Current Coupling"],"prefix":"10.1109","volume":"62","author":[{"given":"Thierry","family":"Lubin","sequence":"first","affiliation":[]},{"given":"Abderrezak","family":"Rezzoug","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1049\/pi-a.1958.0036"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2013.11.014"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/20.748851"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2159357"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2266087"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2151827"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1963.291434"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/20.312568"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.811783"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.839730"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2279073"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.3672408"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2011.5994807"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2183372"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1115\/1.2827990"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/20.280913"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2056379"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2012.6342462"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2143379"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2012678"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2158048"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/20.231636"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2267746"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.1978.1060016"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2013.0050"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2282602"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2288948"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1049\/piee.1975.0278"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2311391"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2006.10.015"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.894560"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/7055987\/06882794.pdf?arnumber=6882794","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:06:33Z","timestamp":1642003593000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6882794"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":31,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2014.2351785","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,4]]}}}