{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,7]],"date-time":"2025-08-07T09:02:15Z","timestamp":1754557335740},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2015]]},"DOI":"10.1109\/tie.2015.2396877","type":"journal-article","created":{"date-parts":[[2015,1,30]],"date-time":"2015-01-30T19:51:00Z","timestamp":1422647460000},"page":"1-1","source":"Crossref","is-referenced-by-count":30,"title":["HMM-driven Robust Probabilistic Principal Component Analyzer for Dynamic Process Fault Classification"],"prefix":"10.1109","author":[{"given":"Jinlin","family":"Zhu","sequence":"first","affiliation":[]},{"given":"Zhiqiang","family":"Ge","sequence":"additional","affiliation":[]},{"given":"Zhihuan","family":"Song","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2008.12.012"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.20099"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(02)00068-9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/aic.14419"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1143844.1143849"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/aic.12200"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2007.11.029"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MASSP.1986.1165342"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1177\/0049124104268644"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1198\/106186002760180518"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2243743"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301761"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"3543","DOI":"10.1021\/ie302069q","article-title":"Review of recent research on data-based process monitoring","volume":"52","author":"ge","year":"2013","journal-title":"Ind Eng Chem Res"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2012.06.016"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1162\/089976699300016728"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2007.07.005"},{"key":"ref1","first-page":"1","author":"chiang","year":"2001","journal-title":"Fault Detection and Diagnosis in Industrial Systems"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/aic.11515"},{"key":"ref20","first-page":"424","author":"bishop","year":"2006","journal-title":"Pattern Recognition and Machine Learning"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/7104192\/07027796.pdf?arnumber=7027796","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:02:18Z","timestamp":1642003338000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7027796\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/tie.2015.2396877","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015]]}}}