{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,26]],"date-time":"2026-06-26T10:24:17Z","timestamp":1782469457061,"version":"3.54.5"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/tie.2015.2417511","type":"journal-article","created":{"date-parts":[[2015,5,8]],"date-time":"2015-05-08T18:34:48Z","timestamp":1431110088000},"page":"3752-3756","source":"Crossref","is-referenced-by-count":298,"title":["Real-time fault diagnosis and fault-tolerant control"],"prefix":"10.1109","volume":"62","author":[{"given":"Zhiwei","family":"Gao","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Steven X.","family":"Ding","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Carlo","family":"Cecati","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399400"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2402642"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2364555"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2364548"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399401"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2386293"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2392713"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2396877"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2362498"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2350451"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2364561"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2367002"},{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4615-5149-2","author":"chen","year":"1999","journal-title":"Robust Model-Based Fault Diagnosis for Dynamic Systems"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2367034"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(90)90018-D"},{"key":"ref6","author":"ding","year":"2008","journal-title":"Model-Based Fault Diagnosis Techniques Design Schemes Algorithms and Tools"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2402645"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-05344-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2281002"},{"key":"ref7","author":"isermann","year":"2008","journal-title":"Fault-Diagnosis Applications"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/37.9163"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301712"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(76)90041-8"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399396"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417511"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2402641"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2386279"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2404784"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2386297"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399397"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/7104192\/07104233.pdf?arnumber=7104233","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:02:19Z","timestamp":1642003339000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7104233\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":32,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2015.2417511","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,6]]}}}