{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,31]],"date-time":"2026-07-31T09:41:37Z","timestamp":1785490897300,"version":"3.56.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"973 Project of China","award":["2013CB733600"],"award-info":[{"award-number":["2013CB733600"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["21176073"],"award-info":[{"award-number":["21176073"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Taishan Visiting Scholar Program of Shandong Province"},{"DOI":"10.13039\/501100000146","name":"Alberta Innovates Technology Futures","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100000146","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2016,1]]},"DOI":"10.1109\/tie.2015.2466557","type":"journal-article","created":{"date-parts":[[2015,8,13]],"date-time":"2015-08-13T17:40:48Z","timestamp":1439487648000},"page":"377-386","source":"Crossref","is-referenced-by-count":348,"title":["Performance-Driven Distributed PCA Process Monitoring Based on Fault-Relevant Variable Selection and Bayesian Inference"],"prefix":"10.1109","volume":"63","author":[{"given":"Qingchao","family":"Jiang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xuefeng","family":"Yan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Biao","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1049\/ic:19950061"},{"key":"ref32","author":"abramson","year":"2004","journal-title":"Genetic Algorithm and Direct Search Toolbox"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1021\/ie0007567"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2013.09.014"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2015.04.001"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2010.03.003"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1038\/scientificamerican0792-66"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2312885"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2328316"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308133"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2009.07.005"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2134059"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(94)00057-U"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690400509"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/cem.667"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-128X(199809\/10)12:5<301::AID-CEM515>3.3.CO;2-J"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-8762(07)73207-0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2336635"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690461213"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/cem.800"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2014.2358674"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1021\/ie980619y"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2058072"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2402112"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2303781"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2311409"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-0347-9","author":"chiang","year":"2001","journal-title":"Fault Detection and Diagnosis in Industrial Systems"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/ie301945s"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2014.05.012"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1021\/ie400544q"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690470115"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2014.05.031"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2014.01.009"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2013.02.001"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/7352402\/7185395.pdf?arnumber=7185395","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:48:08Z","timestamp":1641988088000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7185395\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,1]]},"references-count":36,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2015.2466557","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,1]]}}}