{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,13]],"date-time":"2026-05-13T08:52:23Z","timestamp":1778662343385,"version":"3.51.4"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2016,4,1]],"date-time":"2016-04-01T00:00:00Z","timestamp":1459468800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,4,1]],"date-time":"2016-04-01T00:00:00Z","timestamp":1459468800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,4,1]],"date-time":"2016-04-01T00:00:00Z","timestamp":1459468800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,4,1]],"date-time":"2016-04-01T00:00:00Z","timestamp":1459468800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006445","name":"National Science Foundation (NSF)","doi-asserted-by":"publisher","award":["ECCS 1053717"],"award-info":[{"award-number":["ECCS 1053717"]}],"id":[{"id":"10.13039\/100006445","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51374268"],"award-info":[{"award-number":["51374268"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51375520"],"award-info":[{"award-number":["51375520"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51404051"],"award-info":[{"award-number":["51404051"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61503050"],"award-info":[{"award-number":["61503050"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Application Development Major Projects of Chongqing","award":["cstc2013yykfC0034"],"award-info":[{"award-number":["cstc2013yykfC0034"]}]},{"name":"Training plan of Science and Technology talent of Chongqing","award":["cstc2013kjrc-qnrc40008"],"award-info":[{"award-number":["cstc2013kjrc-qnrc40008"]}]},{"DOI":"10.13039\/501100013084","name":"Program for Innovation Team Building at Institutions of Higher Education","doi-asserted-by":"crossref","award":["KJTD201324"],"award-info":[{"award-number":["KJTD201324"]}],"id":[{"id":"10.13039\/501100013084","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/tie.2016.2515057","type":"journal-article","created":{"date-parts":[[2016,1,5]],"date-time":"2016-01-05T19:20:55Z","timestamp":1452021655000},"page":"2595-2605","source":"Crossref","is-referenced-by-count":37,"title":["Optimized Relative Transformation Matrix Using Bacterial Foraging Algorithm for Process Fault Detection"],"prefix":"10.1109","volume":"63","author":[{"given":"Jun","family":"Yi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Di","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siyao","family":"Fu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haibo","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Taifu","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2130498"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2257135"},{"key":"ref33","first-page":"760","article-title":"Particle swarm optimization","author":"kennedy","year":"2010","journal-title":"Encyclopedia of Machine Learning"},{"key":"ref32","author":"melanie","year":"1998","journal-title":"An Introduction to Genetic Algorithms"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2007.04.002"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2002.1004010"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-59140-312-8"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3724\/SP.J.1004.2008.01128"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2013.04.005"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1021\/ie000141+"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399396"},{"key":"ref11","author":"grjotheim","year":"1993","journal-title":"Introduction to Aluminum Electrolysis---Understanding the Hall-He&#x00B4 roult Process"},{"key":"ref12","first-page":"522","article-title":"An improved UKFNN based on square root filter and strong tracking filter for dynamic evolutionary modeling of aluminum reduction cell","volume":"40","author":"li","year":"2014","journal-title":"Acta Autom Sin"},{"key":"ref13","author":"choate","year":"2003","journal-title":"U S Energy Requirements for Aluminum Production Historical Perspective Theoretical Limits and New Opportunities"},{"key":"ref14","first-page":"523","article-title":"New cathodes in aluminum reduction cells","volume":"2","author":"feng","year":"2010","journal-title":"Light Metals"},{"key":"ref15","first-page":"567","article-title":"Study of ACD model and energy consumption in aluminum reduction cells","volume":"1","author":"tian","year":"2011","journal-title":"Light Metals"},{"key":"ref16","first-page":"613","article-title":"The combined flame and aluminum preheating method","volume":"1","author":"tian","year":"2010","journal-title":"Light Metals"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1023\/A:1015533928104"},{"key":"ref18","article-title":"Research on intelligent health diagnosis system for aluminum electrolysis cells","author":"jiang","year":"2005"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2014.11.021"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2011.270"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2013.0691"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2013.2274289"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"644","DOI":"10.1109\/TNNLS.2012.2185950","article-title":"Tangent hyperplane kernel principal component analysis for deionising","volume":"23","author":"im","year":"2012","journal-title":"IEEE Trans Neural Netw Learn Syst"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417511"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308133"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2011.5937287"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2328316"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3724\/SP.J.1004.2013.00711"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2312885"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2010.12.005"},{"key":"ref22","first-page":"429","article-title":"FMEA-based expert system for electrolysis diagnosis","volume":"1","author":"berezin","year":"2005","journal-title":"Light Metals"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2007.12.009"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2060456"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2345331"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2314075"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.cep.2006.03.016"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2370936"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10853-011-5884-y"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/41\/7428980\/7372408-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/7428980\/07372408.pdf?arnumber=7372408","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:47:10Z","timestamp":1649443630000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7372408\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":42,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2016.2515057","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,4]]}}}