{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T10:21:37Z","timestamp":1777890097111,"version":"3.51.4"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2016,11,1]],"date-time":"2016-11-01T00:00:00Z","timestamp":1477958400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Mid-Career Researcher Program","award":["NRF-2013R1A2A2A01068627"],"award-info":[{"award-number":["NRF-2013R1A2A2A01068627"]}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Ministry of Science, Information and Communications Technology, and Future Planning"},{"name":"Institute of Advanced Machinery and Design"},{"DOI":"10.13039\/501100002551","name":"Seoul National University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002551","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/tie.2016.2586022","type":"journal-article","created":{"date-parts":[[2016,6,29]],"date-time":"2016-06-29T18:22:01Z","timestamp":1467224521000},"page":"7094-7103","source":"Crossref","is-referenced-by-count":41,"title":["An Online-Applicable Model for Predicting Health Degradation of PEM Fuel Cells With Root Cause Analysis"],"prefix":"10.1109","volume":"63","author":[{"given":"Taejin","family":"Kim","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hyunseok","family":"Oh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hyunjae","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Byeng D.","family":"Youn","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2005.10.038"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2008.04.009"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1149\/1.2789377"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/S0022-0728(00)00492-7"},{"key":"ref31","author":"yuan","year":"2009","journal-title":"Electrochemical Impedance Spectroscopy in PEM Fuel Cells Fundamentals and Applications"},{"key":"ref30","year":"2014"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1115\/1.4002467"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2003.09.031"},{"key":"ref35","author":"o'hayre","year":"2006","journal-title":"Fuel Cell Fundamentals"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2011.04.076"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.02.054"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM.2014.7036404"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2014.04.163"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2273477"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2481318"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2014.07.001"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2012.0749"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2015.2457934"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.04.019"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1149\/1.1888367"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2226414"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2008.06.006"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2036024"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2418313"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2069073"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2014.02.019"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1063\/1.1453495"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918399"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2014.05.005"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2013.04.114"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2257152"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2013.10.054"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308148"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2044731"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2060456"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2028295"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2010.2049267"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2008.05.011"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2377131"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2013.12.094"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/7586139\/07501842.pdf?arnumber=7501842","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:42:49Z","timestamp":1641987769000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7501842\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":40,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2016.2586022","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,11]]}}}