{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T13:17:47Z","timestamp":1773839867985,"version":"3.50.1"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["51522701"],"award-info":[{"award-number":["51522701"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100007541","name":"Power Electronics Science and Education Development Program of Delta Environmental & Educational Foundation","doi-asserted-by":"crossref","award":["DREK2015002"],"award-info":[{"award-number":["DREK2015002"]}],"id":[{"id":"10.13039\/501100007541","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1109\/tie.2016.2594171","type":"journal-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:43:47Z","timestamp":1469645027000},"page":"7423-7433","source":"Crossref","is-referenced-by-count":137,"title":["Pseudo-Random High-Frequency Square-Wave Voltage Injection Based Sensorless Control of IPMSM Drives for Audible Noise Reduction"],"prefix":"10.1109","volume":"63","author":[{"given":"Gaolin","family":"Wang","sequence":"first","affiliation":[]},{"given":"Lei","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Bihe","family":"Yuan","sequence":"additional","affiliation":[]},{"given":"Bowen","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Guoqiang","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Dianguo","family":"Xu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2226132"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2243396"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IPEC.2014.6870130"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2354075"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2221132"},{"key":"ref15","first-page":"1129","article-title":"Increased\n signal-to-noise ratio of sensorless control using current oversampling","author":"weber","year":"0","journal-title":"Proc Int Power Electron Conf ECCE Asia"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2181995"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2011.5994913"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2090317"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IPEC.2014.6870124"},{"key":"ref4","article-title":"A","author":"zhan","year":"0","journal-title":"IEEE Trans Ind Electron"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2264791"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2506146"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2228484"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2279382"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2191752"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2276613"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2126552"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2316257"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2210175"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2013.0221"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2278103"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/41.993282"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/63.838113"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4542071"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.810660"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/41\/7738477\/7523425-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/7738477\/07523425.pdf?arnumber=7523425","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:47:10Z","timestamp":1649443630000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7523425\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,12]]},"references-count":26,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2016.2594171","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,12]]}}}