{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:32:17Z","timestamp":1783701137805,"version":"3.55.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/tie.2017.2650861","type":"journal-article","created":{"date-parts":[[2017,1,10]],"date-time":"2017-01-10T19:21:17Z","timestamp":1484076077000},"page":"3940-3949","source":"Crossref","is-referenced-by-count":76,"title":["A Thickness Measurement System for Metal Films Based on Eddy-Current Method With Phase Detection"],"prefix":"10.1109","volume":"64","author":[{"given":"Wei","family":"Li","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yang","family":"Ye","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kang","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhihua","family":"Feng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2013.03.046"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1355298"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2406053"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.4947234"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2006.07.009"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2013.09.016"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2284152"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2282602"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2279364"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.1354405"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2004.09.007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2029525"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098378"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.4891699"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2278999"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.3337725"},{"key":"ref2","first-page":"2525","article-title":"Non-destructive techniques based on eddy current testing","volume":"11","author":"garcia-martin","year":"2011","journal-title":"SENSORS"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/16\/11\/009"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2013.09.007"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IITC.2000.854317"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.04.025"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2247713"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2005.06.003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2479106"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/7895231\/07812706.pdf?arnumber=7812706","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:27:30Z","timestamp":1642004850000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7812706\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":24,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2017.2650861","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,5]]}}}