{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T13:38:55Z","timestamp":1775569135226,"version":"3.50.1"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2017,10,1]],"date-time":"2017-10-01T00:00:00Z","timestamp":1506816000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51405271"],"award-info":[{"award-number":["51405271"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51405272"],"award-info":[{"award-number":["51405272"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/tie.2017.2696503","type":"journal-article","created":{"date-parts":[[2017,4,24]],"date-time":"2017-04-24T21:05:09Z","timestamp":1493067909000},"page":"8042-8054","source":"Crossref","is-referenced-by-count":621,"title":["Synchroextracting Transform"],"prefix":"10.1109","volume":"64","author":[{"given":"Gang","family":"Yu","sequence":"first","affiliation":[]},{"given":"Mingjin","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Chuanyan","family":"Xu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2206331"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2163376"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2458787"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2283552"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2014.09.008"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.1998.0193"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011580"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1137\/100798818"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2015.0205"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2613359"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/78.382394"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/79.752051"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2010.08.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2013.2265316"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2015.2391077"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2276393"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2288192"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2355816"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2124770"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/78.740131"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2686355"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2015.03.004"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8031005\/07906573.pdf?arnumber=7906573","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T17:03:23Z","timestamp":1642007003000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7906573\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":22,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2017.2696503","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,10]]}}}